RF & Microwave
For most of your RF & Microwave measurement needs, you can find application & solution information here.
Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.
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Par application
- RF & Microwave Design (159)
- X-parameters (31)
- Passive Intermodulation (PIM) (5)
- Noise Figure Measurements (22)
- Design & Test Integration (51)
- Pulsed-RF Measurements (15)
- EMI & EMC (29)
- Signal Monitoring, Geolocation (3)
- Impedance (40)
- ESL Design (77)
- Phase-Locked Loops (21)
Par type de contenu
- Spécifications (22)
- Notes d’application (211)
- Dépliants et révisions compétitives (34)
- Guide de sélection & de configuration (5)
- Brefs de solution (28)
- Démos (41)
- Articles et études de cas (64)
- Communiqués de presse (101)
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1-25 sur 506
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Agilent EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.
Bulletin d'information 2013-05-14 |
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Momentum Overview
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.
Démonstration de base 2013-05-08 |
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ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management
Dossier de presse 2013-05-07 |
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EM Insights Series
The EM Insights series is a collection of EM applications from Agilent EEsof EDA.
Notes d’application 2013-05-06 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
Notes d’application 2013-04-12 |
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EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
Brochure 2013-04-09 |
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Agilent to Demonstrate Latest RF Circuit, System and 3-D EM Design & Simulation Solutions at WAMICON
Agilent announces it will demonstrate its latest RF circuit, system and 3-D electromagnetic design and simulation solutions at the 14th annual IEEE Wireless and Microwave Technology Conference. WAMICON 2013 will be held April 7-9 at the Caribe Royale Hotel and Convention Center in Orlando, Fla.
Dossier de presse 2013-04-04 |
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Electronic System-Level (ESL) Applications Center
Electronic System-Level application examples highlighting Agilent’s broad range of ESL applications, design functions and product areas.
Notes d’application 2013-04-02 |
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ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Agilent highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.
Journal 2013-04-02 |
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Enabling Simulation and Test of Custom OFDM Signals
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.
Article 2013-04-01 |
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Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Agilent SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.
Notes d’application 2013-03-28 |
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Agilent Technologies Simulation Software Selected by Plextek RF Integration
Agilent announces that Plextek RF Integration, a UK-based company that designs and develops RFICs, MMICs and microwave/millimeter-wave modules, has selected Agilent software to simulate its new high-frequency circuit and MMIC designs.
Dossier de presse 2013-03-27 |
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Microwave Measurement and Calibration - ATE Systems
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.
Brefs de solution 2013-03-20 |
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
Dossier de presse 2013-03-12 |
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Agilent Technologies Helps Students Acquire Real-World EDA Skills with New Licensing Program
Agilent launches the Agilent EEsof EDA Student License Program, designed to provide access to Agilent EEsof EDA software on students’ personal computers.
Dossier de presse 2013-02-25 |
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Agilent's Newest SystemVue Software Release Accelerates MIMO Radar and Wireless/4G Design
Agilent announces the newest release of SystemVue, its premier platform for designing communications and defense systems.
Dossier de presse 2013-02-14 |
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Faster Validation with Design and Test Integration - Brochure
Agilent's RF workflow environment is the comprehensive way to simulate, measure and analyze communications components and systems. This 8pg brochure covers several examples.
Brochure 2013-02-12 |
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Equivalent Circuit Based Models For Surface Mount RLC Components
Modelithics white paper on understanding S-parameter versus equivalent circuit-based models for surface mount RFC components.
Notes d’application 2013-02-06 |
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Power Meters and Power Sensors - Brochure
This is a comprehensive brochure that covers Agilent’s wide range of power meters and sensors for RF and microwave applications.
Brochure 2013-02-05 |
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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.
Dossier de presse 2013-02-04 |
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High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.
Notes d’application 2013-01-31 |
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Designing Multiple-Throw Switches in a MMIC Configuration
A Chip Design article by P. Sreenivasa Rao, design flow verification expert at Agilent Technologies.
Article 2013-01-31 |
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SystemVue 2013 Technical Overview
SystemVue is a focused EDA environment for electronic system-level (ESL) design that enables system architects and algorithm developers to innovate the physical layer (PHY) of next-generation wireless and aerospace/defense communications systems.
Présentation technique 2013-01-30 |
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Spectrum Analyzer and Signal Analyzer Selection Guide
Agilent offers a wide selection of analyzers and applications. This selection guide will help you more easily identify the right spectrum or signal analyzer to meet your specific measurement needs.
Guide de sélection 2013-01-29 |
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ADS Overview Video
This video shows some of the capabilities that make Agilent's Advanced Design System (ADS) the most comprehensive, easy to use electronic design automation tool available for the design of high-frequency and high-speed products such as a complete multi-technology design flow including layout and verification, integrated EM, and advanced models such as X-parameters.
Démonstration de base 2013-01-25 |
