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EMC Test for R&D – Eretec Inc. 
EMC Test Solution for R&D from Eretec and Agilent

ソリューション概要 2014-04-16

 
Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Agilent

ソリューション概要 2014-04-16

 
On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent

ソリューション概要 2014-04-16

 
Real-Time Printed Circuit Board EMC Measurement - EMSCAN 
Real-Time Printed Circuit Board Electromagnetic Compatibility Measurement from EMSCAN and Agilent

ソリューション概要 2014-04-16

 
NIST Accredited Calibration of Power Sensors – Cal Lab 
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.

ソリューション概要 2014-04-16

 
Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN 
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent

ソリューション概要 2014-04-16

 
Agilent SystemVueによるFPGAのプロトタイプ作成 
このアプリケーション・ノートでは、Agilent SystemVueソフトウェアと、これに統合できるサードパーティ製アプリケーションを使用して、フィールド・プログラマブル・ゲート・アレイ(FPGA)のプロトタイプを作成するデザイン・フローの概要をご紹介します。

アプリケーション・ノート 2014-04-15

Automated LAN Cable Test System - Beta LaserMike 
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.

ソリューション概要 2014-04-09

 
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL 
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL and Agilent.

ソリューション概要 2014-04-09

 
Microwave Measurement and Calibration - ATE Systems 
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.

ソリューション概要 2014-04-09

 
Single Connection Passive Intermodulation and S-Parameter Measurements - ACEWAVETECH 
Single Connection Passive Intermodulation and S-Parameter Measurements – ACEWAVETECH and Agilent

ソリューション概要 2014-04-09

 
Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent

ソリューション概要 2014-04-02

 
Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave 
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Agilent.

ソリューション概要 2014-04-02

 
Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent

ソリューション概要 2014-04-02

 
Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent

ソリューション概要 2014-04-02

 
Average Power Sensor Measurement Uncertainty Calculator - Application Note 
Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H)

アプリケーション・ノート 2014-03-25

XLS XLS 82 KB
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Agilent EEsof EDA's Channel on YouTube

デモ 2014-03-20

 
Discovering ADS 
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

デモ 2014-03-20

 
Agilent LCRメータおよびインピーダンス・アナライザを用いた誘電率/透磁率の測定ソリューション 
LCRメータおよびインピーダンス・アナライザを用いた誘電率/透磁率の測定ソリューション

アプリケーション・ノート 2014-03-17

Using ADS to Investigate Optimal Performance of a Cree FET 
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

アプリケーション・ノート 2014-03-17

PDF PDF 5.41 MB
Pulsed Carrier Phase Noise Measurements - Application Note 
This application note discusses basic fundamentals for making pulsed carrier phase noise measurements.

アプリケーション・ノート 2014-03-13

PDF PDF 1.97 MB
ADS 30-Second Demos 
Watch these videos to learn about popular usability improvements we’ve made in Advanced Design System (ADS) to increase your productivity.

デモ 2014-03-06

 
Agilent Technologies Unveils New 30-Second Demo Series of User-Inspired ADS 2014 Innovations 
Agilent announces the launch of a new series of 30-second demos on user-inspired innovations to its Advanced Design System 2014 software, the industry’s leading electronic design automation software for RF, microwave and signal-integrity applications.

プレス資料 2014-03-06

 
Agilent EEsof EDA SystemVue 2013 
SystemVueは次世代無線や航空宇宙/防衛/通信システムの物理層(PHY)設計における、システム構築やアルゴリズム開発を効率化する設計支援ソリューションです。

技術概要 2014-03-03

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

アプリケーション・ノート 2014-02-26

PDF PDF 1.48 MB

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