Hable con un experto

RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

Refine the List

By Industry/Technology

By Type of Content

By Product Category

1-25 of 537

Sort:
Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2014-07-09

 
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

 
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution 
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Press Materials 2014-06-17

 
Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions 
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Press Materials 2014-06-12

 
Multi-Channel Antenna Calibration Reference Solution - Solution Brochure 
This brochure describes the Agilent Multi-Channel Antenna Calibration, Reference Solution -provides narrow-band antenna calibration: scalable channel count, antenna receive channels downconversion ...

Brochure 2014-06-11

PDF PDF 2.05 MB
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Agilent announces the latest release of Genesys 2014.

Press Materials 2014-06-02

 
Agilent Technologies Introduces Advanced 4G Design and Validation Support  
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Press Materials 2014-06-02

 
Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions 
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

 
Noise Figure Uncertainty Calculator 
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2014-05-19

 
Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare 
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

 
RF Test Solutions – WinSoft 
Military and Commercial RF Test Solutions from WinSoft and Agilent.

Solution Brief 2014-05-14

 
Electromagnetic Compatibility, EMC Pre-compliance Testing – TOYO Corporation 
Electromagnetic Compatibility Pre-compliance Test Solutions from TOYO and Agilent.

Solution Brief 2014-05-14

 
Radiated and Conducted Immunity Testing – TOYO Corporation 
Radiated and Conducted Immunity Test Solutions from TOYO and Agilent

Solution Brief 2014-05-14

 
M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Configuration Guide 2014-05-08

PDF PDF 2.55 MB
Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation 
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Press Materials 2014-05-08

 
Electromagnetic Compatibility, EMC Pre-Compliance Testing – TDK RF Solutions 
Electromagnetic Compatibility Pre-compliance Testing Solution from TDK RF Solutions and Agilent

Solution Brief 2014-05-07

 
Electromagnetic Compatibility, EMC CISPR Compliance Measurements – TDK RF Solutions 
Electromagnetic Compatibility CISPR Compliance Measurement Solution from TDK RF Solutions and Agilent

Solution Brief 2014-05-07

 
Millimeter-Wave FCC Part 15 Transmitter Compliance – OML 
Millimeter-Wave FCC Part 15 Transmitter Compliance Test Solution from OML and Agilent

Solution Brief 2014-05-07

 
Location Sensing Measurements - SkyMark 
Location Sensing Measurement Solutions from SkyMark and Agilent.

Solution Brief 2014-05-07

 
Millimeter-wave S-parameter measurements – OML 
Millimeter-wave S-parameter measurements from OML and Agilent

Solution Brief 2014-05-07

 
Millimeter-wave signal generator – OML 
Millimeter wave signal generator from OML and Agilent

Solution Brief 2014-05-07

 
Millimeter-wave spectrum analysis – OML 
Millimeter-wave spectrum analysis from OML and Agilent

Solution Brief 2014-05-07

 
Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation 
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Press Materials 2014-04-30

 
Magnetic Material Characterization – KEYCOM 
Magnetic Material Characterization Solution from KEYCOM and Agilent.

Solution Brief 2014-04-30

 
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Agilent.

Solution Brief 2014-04-30

 

1 2 3 4 5 6 7 8 9 10 ... Next