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Quad Flat No Lead (QFN) Best Practices 
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

어플리케이션 노트 2008-08-26

PDF PDF 492 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

어플리케이션 노트 2003-08-01

PDF PDF 67 KB
Reducing Load Time for Loaderless Systems 
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

어플리케이션 노트 1999-12-01

 
Reducing Measurement Times in Antenna and RCS Applications 
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

어플리케이션 노트 2010-12-20

PDF PDF 3.15 MB
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

어플리케이션 노트 2001-05-17

PDF PDF 512 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

어플리케이션 노트 2002-06-30

 
RF Mixer Metasystem Behavioral Model 
This Application Note describes the behavioral model of RF Mixer Metasystem.

어플리케이션 노트 1997-04-03

PDF PDF 197 KB
Rotating Boards on a Panel 
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.

어플리케이션 노트 2001-05-17

PDF PDF 40 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Agilent manuals, and wish to use them to do external instrumentation control using the Agilent 3070 Board Test Family.

어플리케이션 노트 2001-05-17

PDF PDF 23 KB
Sampling on the Agilent 5DX 
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.

어플리케이션 노트 2002-05-08

 
Selective Retrieval for Agilent 3070 Board Test Systems with UNIX Controllers 
Most users are very diligent about backing-up their systems in the event of a catastrophic disk failure. Typically, you use SAM to set-up periodic automated backups or create a "crontab" entry to do this.

어플리케이션 노트 1996-07-01

 
SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment 
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.

어플리케이션 노트 2006-06-15

PDF PDF 52 KB
Series II Compliance with the Machinery Directive (in Europe) - specific installation procedures 
Series II will meet requirements of Machinery Directive in European Community member countries, if the following steps, which are described in the document, are taken during installation of equipment.

어플리케이션 노트 2001-05-17

 
Simplified Motor Spin-up Analysis (AN 1200-1) 
This Application Brief offers the Agilent 53310A Modulation Domain Analyzer as a solution to the problem of characterizing a motor's performance without the need for external controller.

어플리케이션 노트 2000-08-01

PDF PDF 100 KB
언어 
Simulating Envelope Tracking with Advanced Design System 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

어플리케이션 노트 2012-11-22

PDF PDF 2.30 MB
Small Engine Dynamometer Testing 
Performing Dynamometer Testing on Combustion Engines

어플리케이션 노트 2008-06-01

PDF PDF 443 KB
Solder Paste Inspection - Organize the Pieces 
Published in Global SMT & Packaging, November 2003

어플리케이션 노트 2003-11-01

PDF PDF 818 KB
Solder Paste Inspection for the SMT line: 3D In-line Systems Come of Age 
Published in Electronic Production & Test, May 2003.

어플리케이션 노트 2003-05-01

PDF PDF 115 KB
Spectrum Analysis... Signal Enhancement (AN 150-7) 
Part Number: 8554-8447. Application Note 150-7 (Jun75)

어플리케이션 노트 1975-06-01

PDF PDF 8.84 MB
Spectrum Analysis: Using External Waveguide Mixers above 40 GHz (AN 150-14) 
This Application Note is for information only. Agilent no longer sells or supports these products.

어플리케이션 노트 1978-12-01

PDF PDF 161 KB
Spectrum Analysis: Using the 11517A External Mixer to 40 GHz (AN 150-12) 
This Application Note is for information only. Agilent no longer sells or supports these products.

어플리케이션 노트 1977-11-01

PDF PDF 398 KB
Speeding Production Line Test Development and Execution at Motorola AEIG 
This application note documents use of TestExec SL to decrease test development time and increase throughput in a case study with Motorola.

어플리케이션 노트 2004-02-11

PDF PDF 214 KB
Synchronizing 3070 System Clocks 
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.

어플리케이션 노트 2001-09-27

PDF PDF 66 KB
System Issues in Boundary-Scan Board Test 
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.

어플리케이션 노트 2003-01-28

PDF PDF 37 KB
Taking and Using Diagnostic Images 
Storing images can be a helpful method for trouble-shooting and collaboration with support. This document explains the methods for taking images. In addition to the software revisions named, the document applies to all 5DX software versions.

어플리케이션 노트 2001-05-17

PDF PDF 61 KB

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