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Oscilloscopes, Analyzers, Meters
1-25 of 51
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8510 Amplifier Linear and Non-Linear Measurements (PN 8510-18)
This Product Note discusses techniques for measuring transmission and reflection characteristics of many amplifiers and active
devices.
Application Note 2006-07-13 |
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8753 Mixer Measurements (PN 8753-2)
This Product Note describes several procedures and hardware setups for measuring the performance of a mixer or frequency translator
using the Agilent 8753B Vector Network Analyzer.
Application Note 2000-11-01 |
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8757 Amplifier Measurements (345-1)
This Application Note describes Microwave Component Measurements: Amplifier Measurements Using the Scalar Network Analyzer.
Application Note 2001-05-15 |
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Accurate Mixer / Amplifier Compression Measurement using the 8901A Modulation Analyzer (AN 286-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1981-04-01 |
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Accurate Mixer Measurements with ENA Frequency-Offset Mode (AN 1463-6)
Recommended measurement procedures for evaluating mixers.
Application Note 2007-05-07 |
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Advanced Measurement Techniques for RF Amplifiers Using Unique Functions of the Agilent E5071C ENA
This application note will briefly review the basic measurement fundamentals of characterizing amplifiers with network analyzers.
Application Note 2007-04-27 |
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AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.
Application Note 2009-08-07 |
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Automotive ECU Transient Testing Using Captured Power System Waveforms
Application Note 2008-01-10 |
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Bearing Runout Measurements (AN 243-7)
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage
capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous
runout, and...
Application Note 2000-05-01 |
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Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications
Application Note 2009-06-05 |
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Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.
Application Note 2009-12-02 |
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Complete S-Parameter and Distortion Measurement for Wide Band Video Amplifier (AN 357-2)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1988-02-01 |
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Direct Characterization of Motion Control Systems (AN 1200-2)
This Application Brief is one of a series. It demonstrates how the Agilent 53310A makes it easy to capture and view velocity profiles, without the need for an external controller.
Application Note 2000-08-01 |
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Effective Machinery Measurements Using Dynamic Signal Analyzers (AN 243-1)
This Application Note outlines the benefits of vibration analysis and provides basic information on making machinery measurements. It explains how vibration is converted to electrical signals and how the frequency domain helps users identify the comp. of signal. It also identifies the vibration...
Application Note 1997-12-01 |
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ENA/PNA - Mixers - Calibration Accuracy using FCA (1408-3)
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3
Application Note 2006-08-08 |
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ENA/PNA - Mixers - Comparing Mixer Measurement Techniques (1408-2)
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.
Application Note 2004-01-28 |
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ENA/PNA - Mixers - New Vector Characterization Techniques
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.
Application Note 2002-10-04 |
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ENA/PNA - Mixers - Transmission Measurements using FCA (1408-1)
Microwave PNA Series Network Analyzer Application Note, mixer transmission measurements using the frequency converter application note 1408-1
Application Note 2003-05-16 |
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ENA/PNA - Mixers - Vector Error Correction
A method for characterizing RF mixers, yielding magnitude and phase response for input match, output match,conversion loss, and mixers which have reciprocal conversion loss and for which the image response can be filtered out.
Application Note 2003-11-11 |
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Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.
Application Note 2000-11-01 |
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Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to
experimental testing (such...
Application Note 2000-05-01 |
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High Precision Time Domain Reflectometry (AN 1304-7)
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements
Application Note 2003-10-27 |
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High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.
Application Note 2003-09-12 |
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How to Characterize CATV Amplifiers Effectively (AN 1288-4)
This application note shows you how to effectively evaluate CATV amplifier performance using the 4396B Network/ Spectrum/Impedance Analyzer.
Application Note 2002-12-12 |
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Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.
Application Note 2012-10-30 |
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