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2 GHz Balanced Mixer using SOT-23 Surface Mount Schottky Diodes (AN 997) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1987-01-01

PDF PDF 332 KB
3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
3070 In System Programming (ISP) Family 
On Board Programming, Bottom Line Benefits

Application Note 2002-07-25

PDF PDF 200 KB
3070 Increasing Throughput 
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.

Application Note 1997-03-03

PDF PDF 41 KB
3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

Application Note 2001-09-12

PDF PDF 1.85 MB
3D Inline Solder Paste Inspection - Benefit Realized 
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.

Application Note 2003-06-01

PDF PDF 59 KB
5DX Virus Protection Software Policy 
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.

Application Note 2004-08-26

 
8510 Amplifier Linear and Non-Linear Measurements (PN 8510-18) 
This Product Note discusses techniques for measuring transmission and reflection characteristics of many amplifiers and active devices.

Application Note 2006-07-13

PDF PDF 396 KB
8510 Mixers - Amplitude and Phase Measurements of Frequency Translation Devices (8510-7A) 

Application Note 2006-07-13

PDF PDF 450 KB
Langues 
8753 Mixer Measurements (PN 8753-2) 
This Product Note describes several procedures and hardware setups for measuring the performance of a mixer or frequency translator using the Agilent 8753B Vector Network Analyzer.

Application Note 2000-11-01

PDF PDF 3.49 MB
8757 Amplifier Measurements (345-1) 
This Application Note describes Microwave Component Measurements: Amplifier Measurements Using the Scalar Network Analyzer.

Application Note 2001-05-15

PDF PDF 1.13 MB
A Low Cost, Surface Mount X-Band Mixer (AN 1052) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1999-11-01

PDF PDF 35 KB
A New Gated-CW Radar Implementation 
Review a gated-CW solution that provides performance and speed improvements for RCS measurements. Reprinted with the permission of Orbit/FR Inc.

Application Note 2004-03-03

PDF PDF 154 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.

Application Note 2003-01-01

PDF PDF 116 KB
A Quality Test Demands A Quality Fixture 
A Check List for getting a quality board test fixture first time, every time.

Application Note 2001-05-16

PDF PDF 26 KB
AC Current Measurements (AN 34) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1959-04-01

PDF PDF 3.90 MB
Accelerate Wireless Mobile Device Design Validation with Automated Test Solution 
This document describes how to accelerate wireless mobile device design validation using Agilent automated test solutions.

Application Note 2007-10-11

PDF PDF 433 KB
Langues 
Accurate Mixer / Amplifier Compression Measurement using the 8901A Modulation Analyzer (AN 286-2) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1981-04-01

PDF PDF 1.43 MB
Accurate Mixer Conversion Loss Measurement Techniques AN 1463-7 
This application note discusses overcoming measurements challenges associated with frequency-translating device (FTD) measurements by using the frequency-offset mode (FOM) option on the ENA RF network analyzers.

Application Note 2005-01-20

PDF PDF 345 KB
Accurate Mixer Measurements with ENA Frequency-Offset Mode (AN 1463-6) 
Recommended measurement procedures for evaluating mixers.

Application Note 2007-05-07

PDF PDF 1.23 MB
Langues 
Advanced Measurement Techniques for RF Amplifiers Using Unique Functions of the Agilent E5071C ENA 
This application note will briefly review the basic measurement fundamentals of characterizing amplifiers with network analyzers.

Application Note 2007-04-27

PDF PDF 698 KB
Langues 
Agilent 3070 Now Powered by Industrial PC Controllers 
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.

Application Note 2003-01-23

PDF PDF 207 KB
Agilent 3070 Outsource Series Pay-Per-Use Board Test System 
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Application Note 2002-03-08

PDF PDF 247 KB
Agilent TestJet Technology White Paper 
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Application Note 2000-01-01

 
AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A 
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.

Application Note 2009-08-07

PDF PDF 1.98 MB
Langues 

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