Application Information About Specific Components & Devices

76-100 of 217

Fundamentals of the z-Domain and Mixed Analog/Digital Measurements (AN 243-4) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1989-08-01	PDF 1.13 MB
Gauge Repeatability on 5DX X-ray System Summary of 5DX repeatability capability, factors that influence the repeatability capabilities of the 5DX, impacts to gauge repeatability and reproducibility (GR&R) results. Application Note 2005-03-09	PDF 102 KB
Generating I-V Curves with the Agilent E4360A Solar Array Simulator Using the Parameters Voc, Isc, N Application Note 2009-03-12
Genesys S/Filter Software Directly Synthesizes Filters with Arbitrary Transmission Zero Placement This white paper describes direct filter synthesis capabilities in Agilent Genesys S/Filter design software used to realize custom filter response. Application Note 2011-01-12	PDF 618 KB Sprachen English \| 2011-01-12 \| PDF 618 KB 中文（简体） \| 2011-01-12 \| PDF 618 KB
Ground Bounce Basics and Best Practices This article offers a description of the physical properties that result in ground bounce during board test. Application Note 2003-01-28	PDF 138 KB
Handling Surface Mapping with Varying Board Construction This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping. Application Note 2004-12-02	PDF 1.02 MB
High IP3 Mixers for Cellular Applications An Application Note focusing on Hittite high IP3 mixer for cellular applications. Application Note 2004-05-25	PDF 344 KB
High Node Count Fixturing Solutions for Agilent Short-Wire Test Fixtures This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Agilent 3070 family of board test systems. Application Note 2008-04-30	PDF 67 KB
High Precision Time Domain Reflectometry (AN 1304-7) Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements Application Note 2003-10-27	PDF 3.72 MB Sprachen English \| 2003-10-27 \| PDF 3.72 MB 日本語 \| 2004-04-20 \| PDF 4.07 MB
High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system. Application Note 2003-09-12	PDF 288 KB
Highly Accurate Amplifier ACLR and ACPR Testing with the Agilent N5182A MXG Vector Signal Generator This note discusses ACLR/ACPR as a key performance characteristic for power amplifiers used to test wireless communications systems and how the Agilent MXG vector signal generator is used to test them. Application Note 2006-08-30	PDF 583 KB Sprachen English \| 2006-08-30 \| PDF 583 KB 中文（简体） \| 2007-05-07 \| PDF 4.89 MB 日本語 \| 2006-09-29 \| PDF 1.07 MB
How and Why: Confirmation and Adjustments This paper describes the process of and reason for periodic adjustment of a 5DX system using the confirmation and adjustment panel. Application Note 2004-12-01	PDF 636 KB
How to build a fixture for use with the Agilent Cover-Extend Technology Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture. Application Note 2011-06-24	PDF 1.09 MB
How to Characterize CATV Amplifiers Effectively (AN 1288-4) This application note shows you how to effectively evaluate CATV amplifier performance using the 4396B Network/ Spectrum/Impedance Analyzer. Application Note 2002-12-12	PDF 463 KB
How To Float, or Series, Agilent 3070 DUT Supplies The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle. Application Note 1997-01-23	PDF 34 KB
How to Get the Most from Agilent's Intelligent Yield Enhancement Test (IYET) This paper describes how to get the most from IYET for Agilent board test systems. Application Note 2005-07-15
Hybrid32 Migration This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems. Application Note 2000-11-01	PDF 61 KB
I-V Curve Characterization in High-Power Solar Cells and Modules This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test. Application Note 2009-09-30	PDF 378 KB
IFT Battery Current Drain Solution Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D. Application Note 2008-09-30	PDF 741 KB Sprachen English \| 2008-09-30 \| PDF 741 KB 日本語 \| 2009-04-30 \| PDF 809 KB
Impedance and Network Analysis Application List Application Note This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers. Application Note 2012-10-30	PDF 1.11 MB
Impedance Matching Techniques for Mixers and Detectors (AN 963) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1980-08-01	PDF 108 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments. Application Note 2001-02-27	PDF 575 KB
In-circuit Testing of Low Voltage Devices Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information. Application Note 2005-05-25	PDF 172 KB
In-System Programming on the Agilent 3070 In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product. Application Note 2001-07-02	PDF 205 KB
Increase Automotive ECU Test Throughput (AN 1505) Application Note 2004-10-22	PDF 58 KB Sprachen English \| 2004-10-22 \| PDF 58 KB 中文（简体） \| 2005-04-01 \| PDF 416 KB 日本語 \| 2005-02-15 \| PDF 230 KB 中文（繁體） \| 2004-12-28 \| PDF 350 KB 한국어 \| 2004-10-22 \| PDF 58 KB

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