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Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

웹캐스트 - recorded

 
Agilent EEsof EDA Customer Education and Services 
Brief overview of Agilent EEsof EDA Customer Education and Services.

교육 자료 2010-08-11

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

웹캐스트 - recorded

 
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

세미나 프리젠테이션 2013-10-22

 
Breakthrough in High Speed Interconnect Analysis and Compliance Testing  
Originally broadcast April 27, 2011

웹캐스트 - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

트래이드쇼

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

웹캐스트 - recorded

 
Fundamentals of Semiconductor Capacitance Measurement Webcast 
Original broadcast October 29, 2013

웹캐스트 - recorded

 
Genesys Webcasts - "How-To-Design" series  
Originally broadcast in 2009. Access the 6 WebEX recordings

웹캐스트 - recorded

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

웹캐스트 - recorded

 
IC-CAP User Training 
This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

교육

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

웹캐스트 - recorded

 
International Microwave Symposium (IMS) 2014 
June 1-16, 2014; Tampa Bay, Florida

트래이드쇼

 
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

세미나 프리젠테이션 2012-02-07

PDF PDF 2.51 MB
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

세미나 프리젠테이션 2013-10-22

PDF PDF 1.48 MB
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA  
Originally broadcast April 19, 2011

웹캐스트 - recorded

 
New Wide Band Gap High-Power Semiconductor Measurement Techniques Webcast 
Live broadcast July 31, 2013; 11am PT/2pm ET

웹캐스트

 
Nonlinear Characterization and Modeling Through Pulsed IV/S-Parameters  
Original broadcast Mar 27, 2012

웹캐스트 - recorded

 
Optimizing PXI Modular Functional Test System Throughput Webcast 
Originally broadcast April 27, 2011

웹캐스트 - recorded

 
PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation 
Originally broadcast Feb 10, 2011

웹캐스트 - recorded

 
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

세미나 프리젠테이션 2011-06-22

PDF PDF 3.07 MB
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

웹캐스트 - recorded