部件和特殊设备

无源模型程序库发生器（PMLG）的演示 This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models. 研讨会演示 2001-04-04	PDF 1.49 MB
Measurement Based FET Modeling using Artifical Neural Networks (ANN) This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series. 研讨会演示 2012-02-07	PDF 2.51 MB
Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models. 研讨会演示 2001-04-04	PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures. 研讨会演示 2003-01-28	PDF 893 KB
Setting up IC-CAP WaferPro for On-Wafer Measurements IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements. 研讨会演示 2011-06-22	PDF 3.07 MB