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Low Cost Antenna Test – Eretec Inc. 
Low Cost Antenna Test Solution from Eretec and Agilent

解決方案簡介 2014-04-16

 
On-Wafer Test of Power Devices – Cascade Microtech 
On-Wafer Test Solution for Power Semiconductor Devices from Cascade Microtech and Agilent

解決方案簡介 2014-04-16

 
Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN 
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent

解決方案簡介 2014-04-16

 
Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

新聞簡訊 2014-04-10

 
Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note 
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

應用手冊 2014-03-26

PDF PDF 745 KB
Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note 
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Agilent U8972A TS-5400 PXI Series functional test system.

應用手冊 2014-03-25

PDF PDF 5.09 MB
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

型錄 2014-03-25

PDF PDF 1.35 MB
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Agilent EEsof EDA's Channel on YouTube

基本展示 2014-03-20

 
Discovering ADS 
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

基本展示 2014-03-20

 
DOCSIS 3.1 Test Solution - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Agilent solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2014-03-19

PDF PDF 1.30 MB
Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise 
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

新聞資料 2014-03-13

 
Agilent Software Gives Students Edge in Job Market 
Design tools are getting University of Arizona engineering students certifiably ready for work in the RF and microwave industry.

新聞資料 2014-02-24

 
Paving the Way for Research and Innovations - Brochure 
This is a selection guide for engineering researchers. It highlights the key research areas that Agilent is involved in, and solutions that can help to meet the research & development objectives.

促銷資料 2014-02-20

PDF PDF 2.62 MB
Agilent Technologies Simulation and Modeling Software Selected by Nitronex for High-Power GaN Design 
Agilent announces that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation.

新聞資料 2014-02-11

 
M9018A PXIe Chassis 18-Slots, 3U, 8GB/s - Data Sheet 
This data sheet describes the capability and advantages of the M9018A PXIe Chassis.

產品型錄 2014-02-11

High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

應用手冊 2014-01-23

Antenna Test - Selection Guide 
Agilent Technologies provides many of the components required to make accurate antenna and radar cross-section (RCS) measurements. Use this guide to: understand how Agilent instruments can be integrated into various configurations, learn about interface requirements between components, understand issues related to selecting the equipment required to make antenna measurements, and learn how to migrate from the 8510 network analyzer or 8530 microwave receiver to the PNA series network analyzer.

選購指南 2013-12-13

MBP and MQA Adopted by Microchip Technology for PDK Creation, Modification, Validation 
Agilent Technologies announces that Microchip Technology Inc., a leading provider of microcontroller, mixed-signal, analog and Flash-IP solutions, has adopted Agilent EEsof EDA's Model Builder Program and Model Quality Assurance software. Microchip Technology will use the software to create internal fabrication device model libraries or process design kits, modify external foundry libraries, and validate supported devices from internal and external sources.

新聞資料 2013-12-09

 
EDA Support Services 
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

型錄 2013-11-09

PDF PDF 128 KB
Modifying DDR Libraries for Silicon Nail Test Generation on the Agilent x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Agilent x1149 Boundary Scan Analyzer.

應用手冊 2013-11-07

PDF PDF 382 KB
Considerations in Making Small Signal Measurements - Application Brief 
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

應用手冊 2013-10-29

PDF PDF 841 KB
Beyond CMOS Vs. GaAs: Picking The Right Technology 
Design software can help evaluate the many different technology options for a high-frequency electronic circuit or system under a wide range of operating conditions.

專文 2013-10-24

 
Releasing the “Test Sequence” and “Test” to Production on the Agilent x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Agilent x1149 Boundary Scan Analyzer.

應用手冊 2013-10-18

PDF PDF 523 KB
Agilent RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Agilent EEsof software design tools and Agilent instruments.

型錄 2013-10-16

PDF PDF 640 KB
CAN Eye-Diagram Mask Testing - Application Note 
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

應用手冊 2013-10-10

PDF PDF 2.61 MB

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