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Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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100G TX Designs - Tips & Techniques for Accurate Characterization Webcast 
Original broadcast on February 27, 2013

Webcast - recorded

 
Accelerating DDR4 Debug and Protocol Validation Webcast 
Original webcast February 26, 2013

Webcast - recorded

 
Accelerating USB 3.0 Protocol Development 
Original broadcast June 27, 2012

Webcast - recorded

 
ADMF: Facing the challenges of Super speed USB 3.0 Product Development  
Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development

Seminar Materials 2008-11-12

PDF PDF 1.78 MB
ADS in 3D: Speed Your Design with Integrated 3D EM Simulation 
Originally broadcast March 24, 2010

Webcast - recorded

 
Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

Webcast - recorded

 
Analyzing Digital Jitter and its Component eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 35 KB
Application-focused Oscilloscope Measurements – Education Webcast Series 
Live broadcasts throughout 2013

Webcast

 
Astonishing Enhancements to Signal Integrity EDA Tools Using Video Game 3D Glasses and GPUs 
Originally broadcast Jan 21, 2010

Webcast - recorded

 
Breakthrough in High Speed Interconnect Analysis and Compliance Testing  
Originally broadcast April 27, 2011

Webcast - recorded

 
Building a Precision Jitter Source 
Presentation, June 1, 2004 From the Japan Agilent Digital Measurement Forum, this presentation reviews the construction of a precision jitter source for analyzing digital jitter measurements.

Seminar Materials 2004-06-01

PDF PDF 623 KB
Case Study: Overcoming Return-path Discontinuity in DDR3/GDDR5 Memory Controller Packages 
Original broadcast October 13, 2011

Webcast - recorded

 
Characterization and Modeling of a High Speed Backplane Differential Channels eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 80 KB
Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope 
Originally broadcast July 27, 2011

Webcast - recorded

 
Conquering USB 3.0 Physical Layer Test Challenges 
Original broadcast June 13, 2012

Webcast - recorded

 
Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices 
Original broadcast Oct 28, 2008. Webcast slides available for download only.

Webcast - recorded

 
Design and Test Challenges in Next Generation High-Speed Serial Standards 
Attend this FREE education workshop at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference.

Training Materials 2011-11-29

 
Digital and Photonics Webcast Series 
Originally broadcast 2010, 2011. Access the recordings of many broadcasts

Webcast - recorded

 
Digital Microwave Radio Basics 
This 1-day course gives an overview of the microwave radio systems that are in use today.

Classroom Training

 
Digital Testing Using Logic Analyzers 
This one-day class will teach the student to configure and use the 16700 series of Logic Analysis tools to design and debug digital systems.

Classroom Training

 
Digital Webcast Series - Master the high-speed digital test challenge 
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list

Webcast - recorded

 
Digitizing Oscilloscope Fundamentals 
This class gives the student an in-depth understanding of the operation and measurement techniques with an Infiniium oscilloscope.

Classroom Training

 
DisplayPort 1.2 Physical Layer Testing 
Original broadcast October 30, 2012

Webcast - recorded

 
EDN Editorial Webcast: Signal Integrity and High-Speed Board Design 
Originally broadcast Jan 25, 2011

Webcast - recorded

 
Effective Crosstalk Characterization Webcast 
Original broadcast January 24, 2013

Webcast - recorded

 

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