Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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Oscilloscopes, Analyzers, Meters (51)
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- LCR Meters & Impedance Measurement Products (5)
- Digitizers (4)
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- Dynamic Signal Analyzers, Materials Measurement (2)
- Parameter & Device Analyzers, Curve Tracer (2)
Generators, Sources, Supplies (17)
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26-50 of 92

EDN Editorial Webcast: Signal Integrity and High-Speed Board Design Originally broadcast Jan 25, 2011 Webcast - recorded
Effective Crosstalk Characterization Webcast Original broadcast January 24, 2013 Webcast - recorded
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility August 5- 9, 2013; Denver, CO Tradeshow
Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast Original broadcast March 20, 2013 Webcast - recorded
Genesys Webcasts - "How-To-Design" series Originally broadcast in 2009. Access the 6 WebEX recordings Webcast - recorded
Hacking the Backplane:Complete Differential Channel Characterization & Analysis from 4-port Meas. Seminar Materials 2008-11-09
High Performance Logic Analysis Techniques Learn to use the 16700A series of Logic Analysis tools to observe and analyze not only one component but also many independent devices in a system. Classroom Training
High-Sensitivity Current Measurements using an Oscilloscope Webcast Original broadcast April 17, 2013 Webcast - recorded
High-speed Oscilloscope Probing: Ensuring Maximum Performance and Signal Integrity Originally broadcast March 10, 2011 Webcast - recorded
How to Solve DDR Signal Integrity Validation Challenges How to Solve DDR Signal Integrity Validation Challenges Training Materials 2008-02-13
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 2011 show, last June, 2011; Baltimore Convention Center Tradeshow
IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue June 17-22, 2012 in Montréal, Canada Tradeshow
IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue June 2 - 7, 2013 in Seattle, WA Tradeshow
InfiniBand Compliance and System Testing This tutorial provides an overview of Infiniband test requirements, compliance and system tests, and performance measurements. Training Materials 2002-07-26	PDF 906 KB
Innovations in EDA: Multi-Technology RF Design Using the New Advances in ADS 2011 Originally broadcast March 1, 2011 Webcast - recorded
Innovations in EDA: Opto-Electronic Signal Integrity on Optical Fiber Chip-to-Chip Link Originally broadcast April 7, 2011 Webcast - recorded
Innovations in EM Simulation for High Speed Digital Design Originally broadcast Nov 18, 2010; Part of the Series: Signal Integrity for High Speed Digital Interconnects. Webcast - recorded
Introduction to Digital RF Communications This course teaches the basics of vector modulation, effectively the basics of digital modulation. Classroom Training
Introduction to EMI/EMC Challenges and Their Solution Agilent EEsof EDA presentation on how to, "Overcome High Speed Digital Design Challenges". Seminar Materials 2012-02-16	PDF 3.46 MB
Is Simulation a Requirement for Memory Designs Webcast Live broadcast February 20, 2013; 10am Pacific / 1pm Eastern Webcast
Jitter Analysis: What Works, What Doesn't & Why eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 63 KB
Jitter in Digital Circuits eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 34 KB
Jitter Measurements for High-Speed Digital Jitter Measurements for High-Speed Digital Transmission Seminar Materials 2006-06-14	PDF 44 KB
Jitter Measurements with a High-Speed Scope eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 117 KB
Learn to Analyze, Validate and Debug High Speed DDR3 Memory Original broadcast Oct 4, 2011 Webcast - recorded

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