Digital Design & Interconnect Standards
Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.
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126-150 of 164
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S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding
Application Note 2012-03-01 |
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1967-02-01 |
PDF
3.10 MB
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SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8)
Due to the inherent limitations of parallel
technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments.
Application Note 2012-01-31 |
PDF
2.73 MB
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Saving Time with Multiple-Channel Signal Integrity Measurements, (AN 1382-8)
System complexity continues to grow exponentially. This results in more buses with more high-speed signals, which translates into more chances of signal integrity problems. Complex protocols, varying data payloads, and multiple operating modes create more opportunities for signal integrity to be...
Application Note 2002-03-14 |
PDF
1.29 MB
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Selecting an I/O Architecture for Your FPGA Design
Selecting an I/O Architecture for Your FPGA Design
Application Note 2005-02-25 |
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Separating Read/Write Signals for DDR DRAM and Controller Validation
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.
Application Note 2008-12-19 |
PDF
805 KB
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Serial ATA Interoperability Program Cable Test MOI for Agilent 86100C
Application Note 2006-06-20 |
PDF
480 KB
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
Application Note 2007-01-01 |
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3.50 MB
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
Application Note 2007-02-21 |
PDF
2.75 MB
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
Application Note 2007-07-01 |
PDF
2.44 MB
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Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).
Application Note 2012-04-02 |
PDF
5.68 MB
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Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.
Application Note 2011-11-15 |
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Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...
Application Note 2006-12-12 |
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382 KB
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Soft Touch Connectorless Logic Analyzer Probes
Application Note 2011-03-14 |
PDF
193 KB
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Solutions for MB-OFDM Ultra-Wideband (UWB) Application Note
Application note describes hardware and software for ultra wideband (UWB) testing.
Application Note 2008-08-10 |
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2.63 MB
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Spectral Analysis Using a Deep Memory Oscilloscope FFT (AN 1383-1))
Many of today's digital oscilloscopes include a Fast Fourier Transform (FFT) for frequency-domain analysis. This feature is especially valuable for oscilloscope users who have limited or no access to a spectrum analyzer yet occasionally need frequency-domain analysis capability. An integrated...
Application Note 2001-11-15 |
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1.54 MB
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Spectrum Analysis Application Notes
Download a copy of AN150, both high and low resolution PDF's are available.
Application Note 2004-04-27 |
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Speeding and Easing Validation Testing with PCI Verification Tools
With the help of powerful PCI cards and analyzers, such as the E2925 and E2926 PCI Series of Computer Verification Tools
Application Note 2002-05-13 |
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Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)
Application Note 2009-06-01 |
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Testing 10 Gbit/s Ethernet Devices
The purpose of this anual is to assist you when you are setting up and executing tests for 10 Gbit/s Ethernet (10GbE) devices.
Application Note 2003-02-21 |
PDF
959 KB
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The Quest For a New Generation Analyzer
Compatibility testing and the integration into a tightly coupled system of several Compact PCI cards within one backplane.
Application Note 2002-05-13 |
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Time Domain Reflectometry Theory (AN 1304-2)
This application note discusses the fundamentals of TDR and then relates these fundamentals to the parameters that can be measured in actual test situations.
Application Note 2002-08-29 |
PDF
190 KB
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Total Jitter Measurement at Low Probability Levels
White paper produced for DesignCon 2005 regarding Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method.
Application Note 2005-07-11 |
PDF
222 KB
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Total Jitter Measurements at Low Probability Levels, Using Optimized BERT Scan Method
This paper describes an optimized technique based on probabliity and statistics theory that enables accurate TJ measurements at the 1e-12 bit error ratio level in about 20 minutes at 10 Gbit/s.
Application Note 2005-07-11 |
PDF
894 KB
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Transforming Oscilloscope Acquisitions for De-Embedding, Embedding and Simulating Channel Effects
Covers fundamentals of understanding the design parameters, the various methods of data acquisition and implementing the results into a first-class design
Application Note 2012-03-05 |
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