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- MHL 설계 및 테스트 (2)
- PCI Express 설계 및 테스트 (18)
- 직렬 ATA (SATA) (13)
- SAS(Serial Attached SCSI) (6)
- USB (2.0/3.0/무선) (12)
분야별 검색결과
제품 카테고리별
1-25 / 166
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An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.
어플리케이션 노트 2013-06-06 |
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606 KB
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Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.
어플리케이션 노트 2013-05-31 |
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1.40 MB
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Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR
어플리케이션 노트 2013-05-21 |
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2.13 MB
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
어플리케이션 노트 2013-05-10 |
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2.02 MB
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
어플리케이션 노트 2013-04-24 |
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2.02 MB
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MOI for DisplayPort PHY CTS 1.2b Sink Tests
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.
어플리케이션 노트 2013-03-21 |
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7.99 MB
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MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.
어플리케이션 노트 2013-03-21 |
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5.63 MB
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Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2013-02-18 |
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1.29 MB
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Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2013-02-14 |
PDF
1.76 MB
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
어플리케이션 노트 2013-01-24 |
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1.65 MB
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Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2012-12-17 |
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1.82 MB
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DDR Memory Overview, Development Cycle, and Challenges - Technical Overview
Thanks to improved manufacturing processes that have driven down costs, the technology of choice is now DDR SDRAM, short for Double Data Rate Synchronous Dynamic Random Access Memory.
어플리케이션 노트 2012-12-14 |
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1.37 MB
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Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.
어플리케이션 노트 2012-11-01 |
PDF
257 KB
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Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2012-10-16 |
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1.62 MB
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Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.
어플리케이션 노트 2012-09-21 |
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S-파라미터 시리즈: PrInfiniiSim 파형 변환 툴세트의 실제 적용 어플리케이션 노트 (영문)
엔지니어들이 오실로스코프를 사용하여 고속 링크의 성능을 측정할 때 주로 직면하는 가장 일반적인 문제 5가지를 살펴보고 이를 어떻게 해결하는지 알아봅니다.
어플리케이션 노트 2012-08-21 |
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Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.
어플리케이션 노트 2012-05-02 |
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6.46 MB
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Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.
어플리케이션 노트 2012-04-06 |
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3.21 MB
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Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).
어플리케이션 노트 2012-04-02 |
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5.68 MB
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USB 3.0 Protocol Testing with Active Error Insertion Application Note
Speed up design and verification of USB designs using the U4612A Jammer
어플리케이션 노트 2012-03-19 |
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3.51 MB
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S-파라미터 시리즈: 가상 프로빙에 디임베딩 툴 사용 어플리케이션 노트(영문)
까다로운 측정 포인트에 대한 가상 액세스를 위해 디임베딩 툴을 사용하는 방법에 대해 설명합니다.
어플리케이션 노트 2012-03-11 |
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채널 효과를 디임베딩, 임베딩 및 시뮬레이션하기 위해 오실로스코프 수집 변환 (영문)
설계 파라미터 이해의 기초, 다양한 데이터 수집 방법 및 결과를 설계에 구현하는 방법을 다룹니다.
어플리케이션 노트 2012-03-05 |
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S-파라미터 시리즈: 오실로스코프 디임베딩 어플리케이션의 S-파라미터 요구사항 (영문)
오실로스코프 데이터 상호운용 및 이러한 데이터와 S-파라미터의 관계를 이해하는 방법을 전체적으로 파악할 수 있도록 도와주는 자습서입니다.
어플리케이션 노트 2012-03-02 |
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S-파라미터 시리즈: 시간 도메인 반사계 사용에 관한 어플리케이션 노트 (영문)
시간 도메인 반사계는 디지털 설계자들에게 기존의 임피던스 측정을 표시하는 강력한 툴과 디임베딩을 위해 정확한 S-파라미터 측정을 생성하는 솔루션을 제공합니다.
어플리케이션 노트 2012-03-01 |
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
어플리케이션 노트 2012-02-02 |
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1.59 MB
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