|
|
PDF
263 KB
|
10 Hints for Getting the Most from your Frequency Counter
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.
|
2008-04-18
|
Application Note
|
|
|
|
PDF
1.58 MB
|
7 Hints for Making Innovative Signal Source Measurements
This application note provides tips for making signal source measurements in wireless RF design and verification using the signal source ananlyzer.
|
2004-09-22
|
Application Note
|
|
|
|
PDF
2.24 MB
|
8 Hints for Debugging and Validating High-speed Buses
8 Hints for Debugging High-speed Buses
|
2002-03-05
|
Application Note
|
|
|
|
PDF
736 KB
|
8 Hints for Debugging Siemens MCU-based Designs
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from
Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the
same time. This MSO offers more...
|
1998-11-01
|
Application Note
|
|
|
|
PDF
792 KB
|
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate
synchronous dynamic random access memory) signals.
|
2008-09-10
|
Application Note
|
|
|
|
PDF
284 KB
|
Accurate Capacitance Characterization at the Wafer Level (AN 4070-2)
This Application Note describes practical techniques to accurately evaluate capacitance of semiconductor device at the wafer level.
|
2000-11-01
|
Application Note
|
|
|
|
PDF
549 KB
|
Advanced Jitter Generation and Analysis Product Note
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.
|
2004-10-04
|
Application Note
|
|
|
|
PDF
812 KB
|
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
|
2005-09-22
|
Application Note
|
|
|
|
|
Agilent E2920 PCI Series: HP HSTC speeds High End Server Testing and reduces Engineering Costs
HP HSTC speeds High End Server Testing and reduces Engineering Costs with Agilent E2920 PCI Series
|
2004-07-14
|
Application Note
|
|
|
|
|
Agilent E2920 PCI Series: HP NSD stabilizes Server Designs quickly and completely with the...
One method NSD uses to accelerate development is to apply the Agilent E2920 PCI Series of Verification Tools to bring up, debug, and validate its PCI-based designs early in the process.
|
2004-07-14
|
Application Note
|
|
|
|
PDF
1.98 MB
|
Agilent Method of Implementation (MOI) for DisplayPort
Agilent Method of Implementation (MOI) for DisplayPort Sink Compliance Tests
|
2007-11-03
|
Application Note
|
|
|
|
PDF
6.84 MB
|
Agilent MOI Document for SATA PHY, TSG and OOB Measurements
|
2009-08-27
|
Application Note
|
|
|
|
PDF
2.12 MB
|
Agilent MOI for SATA RSG Tests
|
2009-09-17
|
Application Note
|
|
|
|
PDF
479 KB
|
Agilent MOI for SATA TXRX Tests Using Agilent 86100C TDR
|
2009-09-10
|
Application Note
|
|
|
|
PDF
3.99 MB
|
Agilent N4900 Serial BERT Series Jitter Injection and Analysis Capabilities
The fundamentals of Jitter and it's capabilities with the N4900.
|
2003-11-01
|
Application Note
|
|
|
|
PDF
817 KB
|
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.
|
2008-08-29
|
Application Note
|
|
|
|
PDF
412 KB
|
Application Note1: Check for PCI and PCI-X protocol rule violation
The Agilent Protocol Observer, in combination with the Agilent Analyzer, simplifies the task of detecting protocol rule violations; this is not easy ...
|
2001-09-28
|
Application Note
|
|
|
|
PDF
556 KB
|
Application Note2: Verify if a device can stand all kinds of protocol variations
Validating servers and workstations that contain various I/O systems, various peripherals and high and low-speed devices, has become a sophisticated task.
If you are a validation engineer, you have to ensure that server products can stand all possible protocol variations; that corner cases...
|
2001-10-04
|
Application Note
|
|
|
|
PDF
469 KB
|
Application Note3: Analyze how efficiently a device uses PCI/PCI-X resources
The Agilent PCI/PCI-X Performance Optimizer, a combination of testcard and software, provides help regarding performance analysis of extensive systems or signle devices.
If you perform benchmark tests, The Agilent PCI/PCI-X Performance Optimizer helps you quickly evaluate the performance of...
|
2001-10-04
|
Application Note
|
|
|
|
PDF
363 KB
|
Application Note4: Read and write register values of your device before a driver is available
The Agilent PCI/PCI-X Exerciser, a combination of testcard and software, simplifies the task of reading values from (peek) and writing values into (poke) registers or memory before a driver is available.
Aims of this Application Note
To show how to access registers of a device before a...
|
2001-10-05
|
Application Note
|
|
|
|
PDF
406 KB
|
Application Note5: Monitor how your device acts on the PCI/PCI-X bus
Monitoring traffic on the PCI/PCI-X bus is done easily, but if you are designing PCI/PCI-x devices, you need to monitor the traffic relating to a particular device. This application allows you to debug your system quickly and effectively.
The Agilent PCI/PCI-X Analyzer, a combination of...
|
2001-10-04
|
Application Note
|
|
|
|
PDF
444 KB
|
Automated PCI Express Receiver Compliance Test and Characterization with N5990A
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.
|
2006-08-29
|
Application Note
|
|
|
|
PDF
272 KB
|
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages
|
2007-01-31
|
Application Note
|
|
|
|
PDF
116 KB
|
Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.
|
2008-04-10
|
Application Note
|
|
|
|
PDF
2.9 MB
|
Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
|
2008-11-21
|
Application Note
|
|
