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Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects 
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

Application Note 2005-09-08

PDF PDF 11.72 MB
Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) 
Understand how to get minimal probe loading and highest-possible-performance representation of your signal.

Application Note 2002-11-01

PDF PDF 912 KB
Languages 
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

PDF PDF 1.17 MB
Languages 
Jitter Analysis Techniques for High Data Rates (AN 1432) 
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

PDF PDF 4 MB
Languages 
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Application Note 2005-06-15

PDF PDF 515 KB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

Application Note 2003-12-02

PDF PDF 3.18 MB
Low Voltage Differential Signaling, (AN 1382-6) 
Using LVDS for High Speed Data Transmission

Application Note 2001-12-17

PDF PDF 2.53 MB
Languages 
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

PDF PDF 426 KB
Languages 
Measuring Jitter in Digital Systems (AN 1448-1) 
Measuring jitter and how to calculate total jitter.

Application Note 2008-01-30

PDF PDF 1.91 MB
Measuring Jitter with the Agilent E4874A Characterization Software Components 
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...

Application Note 2000-06-01

PDF PDF 102 KB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test 
Method of Implementation (MOI) for DisplayPort Sink Compliance Test

Application Note 2008-08-18

PDF PDF 1.87 MB
Microprobing with the Agilent 86100A Infiniium DCA (AN 1304-3) 
A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech high frequency probes.

Application Note 2000-11-01

PDF PDF 1.84 MB
PCI Express Receiver Design Validation Test with 81134A / 81250A 
Describes functional validation and compliance and stress tests for PCI Express receiver design

Application Note 2005-03-18

PDF PDF 2.01 MB
Languages 
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note 
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse 

Application Note 2008-12-03

PDF PDF 1000 KB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B  
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.

Application Note 2006-01-30

PDF PDF 1.31 MB
Languages 
Precision Jitter Analysis Using the Agilent 86100C DCA-J (PN 86100C-1) 
This product note provides a guide to making jitter measurements with the Agilent 86100C DCA-J.

Application Note 2007-03-07

PDF PDF 1.64 MB
Languages 
Precision Jitter Transmitter 
This paper introduces a precisely calibrated jitter source capable of applying a wide variety of jitter signals in different combinations at adjustable amplitudes. The system, calibration techniques, and examples are discussed.

Application Note 2005-06-20

PDF PDF 387 KB
Precision Waveform Analysis for High-Speed Digital Communications Technical Overview 
his document will discuss the Agilent 86108A precision waveform analyzer plug-in module with the Agilent 86100C DCA-J sampling oscilloscope mainframe for accurate analysis of high-speed digital communications signals.

Application Note 2008-04-17

PDF PDF 1.88 MB
Languages 
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6) 
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.

Application Note 2011-07-28

PDF PDF 651 KB
Languages 
SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8) 
Due to the inherent limitations of parallel technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments.

Application Note 2012-01-31

PDF PDF 2.73 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS 
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding 
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Spectral Analysis Using a Deep Memory Oscilloscope FFT (AN 1383-1)) 
Many of today's digital oscilloscopes include a Fast Fourier Transform (FFT) for frequency-domain analysis. This feature is especially valuable for oscilloscope users who have limited or no access to a spectrum analyzer yet occasionally need frequency-domain analysis capability. An integrated...

Application Note 2001-11-15

PDF PDF 1.54 MB
Languages 

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