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정렬방식:
고대역폭 액티브 오실로스코프 프로브의 유용성과 성능 비교 이해(AN 1419-02)  
프로브 로딩을 최소화하고 최고 성능의 신호 구현을 위한 방법을 이해합니다.

어플리케이션 노트 2002-11-01

PDF PDF 806 KB
언어 
애질런트 86100C DCA-J(PN 86100C-1)를 사용한 고정밀 지터 분석 

어플리케이션 노트 2007-03-07

PDF PDF 1.64 MB
언어 
오실로스코프의 샘플 율 대 샘플링 정확도의 평가 : 어떻게 가장 정확한 디지털 측정을 할 것인가 
오실로스코프 샘플링 속도와 샘플링 충실도 비교 평가: 가장 정확한 디지털 측정 수행 방법. 정확한 측정을 위해 오실로스코프 선택 시 종종 샘플링 충실도가 최대 샘플링 속도보다 더 중요합니다.

어플리케이션 노트 2006-09-28

PDF PDF 1.31 MB
언어 
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses 
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.

어플리케이션 노트 2008-09-10

PDF PDF 792 KB
언어 
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

어플리케이션 노트 2011-06-22

PDF PDF 4.82 MB
언어 
Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

어플리케이션 노트 2004-10-04

PDF PDF 549 KB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper 
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

어플리케이션 노트 2011-09-01

PDF PDF 2.20 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T 
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

어플리케이션 노트 2011-01-11

PDF PDF 1.21 MB
언어 
Automated PCI Express Receiver Compliance Test and Characterization with N5990A 
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.

어플리케이션 노트 2006-08-29

PDF PDF 444 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A 
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

어플리케이션 노트 2007-01-31

PDF PDF 272 KB
Benefits of using PCI Express 2.0. 
An overview of the main features and benefits of using PCI Express 2.0

어플리케이션 노트 2008-10-17

PDF PDF 764 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A 
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

어플리케이션 노트 2006-07-18

PDF PDF 5.33 MB
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process 
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

어플리케이션 노트 2008-11-20

PDF PDF 688 KB
언어 
Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1 
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.

어플리케이션 노트 2000-08-01

PDF PDF 2.01 MB
언어 
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

어플리케이션 노트 2006-04-06

PDF PDF 164 KB
Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) 
Debugging USB 2.0 Systems

어플리케이션 노트 2006-10-05

PDF PDF 392 KB
언어 
Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

어플리케이션 노트 2000-11-01

PDF PDF 349 KB
언어 
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode 
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

어플리케이션 노트 2005-09-21

PDF PDF 356 KB
Fast Total Jitter Test Solution 
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

어플리케이션 노트 2005-08-29

PDF PDF 1.28 MB
Faster Risetime for TDR Measurements (PN 86100-4) 
This product note demonstrates how to make time domain reflection (TDR) measurements on electrical networks with better than 40 ps resolution.

어플리케이션 노트 2001-07-01

PDF PDF 943 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) 
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

어플리케이션 노트 2003-06-30

PDF PDF 1.70 MB
언어 
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

어플리케이션 노트 2009-03-24

PDF PDF 606 KB
HDMI Sink and Source Compliance Test and Characterization 
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.

어플리케이션 노트 2006-10-27

PDF PDF 431 KB
언어 
High Precision Time Domain Reflectometry (AN 1304-7) 
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements

어플리케이션 노트 2003-10-27

PDF PDF 3.72 MB
언어 
High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module 
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

어플리케이션 노트 2003-09-12

PDF PDF 288 KB

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