Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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  - Application Note (115)

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- Oscilloscopes, Analyzers, Meters
  - Oscilloscopes (46)
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1-25 of 115

Time Domain Reflectometry Theory - Application Note When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics. Application Note 2013-05-31	PDF 1.40 MB Languages English \| 2013-05-31 \| PDF 1.40 MB 日本語 \| 2000-03-01 \| PDF 1.42 MB
Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR Application Note 2013-05-21	PDF 2.13 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing. Application Note 2013-05-10	PDF 2.02 MB Languages English \| 2013-05-10 \| PDF 2.02 MB 日本語 \| 2010-01-14 \| PDF 3.64 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR. Application Note 2013-04-24	PDF 2.02 MB
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2013-02-18	PDF 1.29 MB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2013-02-14	PDF 1.76 MB Languages English \| 2013-02-14 \| PDF 1.76 MB 日本語 \| 2013-02-14 \| PDF 1.76 MB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-12-17	PDF 1.82 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate. Application Note 2012-11-11	PDF 1.56 MB Languages English \| 2012-11-11 \| PDF 1.56 MB 日本語 \| 2007-03-08 \| PDF 5.15 MB 中文（繁體） \| 2009-04-24 \| PDF 2.14 MB 한국어 \| 2006-09-28 \| PDF 1.31 MB
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2012-10-16	PDF 1.62 MB
Crossing the Digital-Analog Divide - White Paper This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform. Application Note 2012-05-02	PDF 6.46 MB
USB 3.0 Protocol Testing with Active Error Insertion Application Note Speed up design and verification of USB designs using the U4612A Jammer Application Note 2012-03-19	PDF 3.51 MB
6 Hints for Better SATA and SAS Measurements These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges. Application Note 2012-02-02	PDF 1.59 MB
SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8) Due to the inherent limitations of parallel technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments. Application Note 2012-01-31	PDF 2.73 MB
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver. Application Note 2012-01-12	PDF 416 KB Languages English \| 2012-01-12 \| PDF 416 KB 日本語 \| 2012-02-27 \| PDF 1.45 MB
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-12-01	PDF 918 KB
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-12-01	PDF 920 KB
How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative. Application Note 2011-11-30	PDF 3.22 MB Languages English \| 2011-11-30 \| PDF 3.22 MB 日本語 \| 2012-07-20 \| PDF 4.98 MB
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products. Application Note 2011-10-28	PDF 1.01 MB
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Advanced Techniques for PCIe 3.0 Receiver Testing-Paper Application Note 2011-09-01	PDF 2.20 MB
Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6) Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope. Application Note 2011-07-28	PDF 651 KB Languages English \| 2011-07-28 \| PDF 651 KB 日本語 \| 2007-04-10 \| PDF 578 KB
Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR. Application Note 2011-07-08	PDF 1.77 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0. Application Note 2011-06-22	PDF 4.82 MB Languages English \| 2011-06-22 \| PDF 4.82 MB 日本語 \| 2011-07-27 \| PDF 3.05 MB
Soft Touch Connectorless Logic Analyzer Probes Application Note 2011-03-14	PDF 193 KB Languages English \| 2011-03-14 \| PDF 193 KB 日本語 \| 2006-11-27 \| PDF 680 KB 한국어 \| 2006-11-01 \| PDF 193 KB
MOI for SATA PHY, TSG and OOB Tests - Application Note 2011-01-20	PDF 7.10 MB
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR Application Note 2011-01-12	PDF 1.19 MB

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