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Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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6 Hints for Better SATA and SAS Measurements 
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Application Note 1998-11-01

PDF PDF 736 KB
Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1 
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.

Application Note 2000-08-01

PDF PDF 2.01 MB
Languages 
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB
Crossing the Digital-Analog Divide - White Paper 
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

PDF PDF 6.46 MB
Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) 
Debugging USB 2.0 Systems

Application Note 2006-10-05

PDF PDF 392 KB
Languages 
Designing and Validating High-Speed Memory Buses (AN 1382-2) 
DDR SDRAM (double data rate synchronous dynamic random access memory) is quickly becoming an accepted technology in the PC (personal computer) industry. Its low cost, high performance, and increasingly wide availability make it very desirable for PC memory buses and embedded designs such as high...

Application Note 2001-12-20

PDF PDF 1.51 MB
Languages 
Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

Application Note 2000-11-01

PDF PDF 349 KB
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Faster Risetime for TDR Measurements (PN 86100-4) 
This product note demonstrates how to make time domain reflection (TDR) measurements on electrical networks with better than 40 ps resolution.

Application Note 2001-07-01

PDF PDF 943 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) 
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

PDF PDF 1.70 MB
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High Precision Time Domain Reflectometry (AN 1304-7) 
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements

Application Note 2003-10-27

PDF PDF 3.72 MB
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High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module 
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Application Note 2003-09-12

PDF PDF 288 KB
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Application Note 2007-07-30

PDF PDF 611 KB
Improve Your Time-to-Insight:Debugging Intermittent Memory Failures in DDR and DDR2 Systems 
Application Note 1575

Application Note 2006-04-14

PDF PDF 120 KB
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Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects 
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

Application Note 2005-09-08

PDF PDF 11.72 MB
Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) 
Understand how to get minimal probe loading and highest-possible-performance representation of your signal.

Application Note 2002-11-01

PDF PDF 912 KB
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Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Application Note 2008-01-30

PDF PDF 1.17 MB
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Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Application Note 2005-06-15

PDF PDF 515 KB
Low Voltage Differential Signaling, (AN 1382-6) 
Using LVDS for High Speed Data Transmission

Application Note 2001-12-17

PDF PDF 2.53 MB
Languages 
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

PDF PDF 426 KB
Languages 
Microprobing with the Agilent 86100A Infiniium DCA (AN 1304-3) 
A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech high frequency probes.

Application Note 2000-11-01

PDF PDF 1.84 MB
Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope 
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.

Application Note 2009-06-01

PDF PDF 3.03 MB
Languages 
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note 
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Planning Your Design for Debug: FPGA Dynamic Probe 

Application Note 2005-01-26

PDF PDF 785 KB
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