Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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  - Application Note (165)

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Oscilloscopes, Analyzers, Meters (115)
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76-100 of 165

Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics. Application Note 2005-09-08	PDF 11.72 MB
Improving the Accuracy of Optical Transceiver Extinction Ratio Measurements (AN 1550-9) This paper discusses extinction ratio - measurement challenges and causes of measurement uncertainty & variability. In addition, it describes methods for reducing uncertainties caused by non-ideal performance of standard reference receivers. Application Note 2009-02-21	PDF 672 KB Langues English \| 2009-02-21 \| PDF 672 KB 日本語 \| 2009-04-28 \| PDF 867 KB
Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) Understand how to get minimal probe loading and highest-possible-performance representation of your signal. Application Note 2002-11-01	PDF 912 KB Langues English \| 2002-11-01 \| PDF 912 KB 中文（简体） \| 2003-06-05 \| PDF 1.20 MB 日本語 \| 2003-02-10 \| PDF 443 KB 中文（繁體） \| 2002-12-10 \| PDF 1.08 MB 한국어 \| 2002-11-01 \| PDF 806 KB
In-circuit Debug of FPGAs This application note covers key methods of debugging FPGAs along with technologies that reduce the number of pins needed for debug. Application Note 2003-05-01	PDF 1.43 MB Langues English \| 2003-05-01 \| PDF 1.43 MB 日本語 \| 2003-07-03 \| PDF 653 KB
InfiniBand System Level Debugging (AN 1382-1) This application note is written for R & D engineers developing InfiniBand processors and InfiniBand system designers and integrators. It covers key concepts underlying system-level debug and validation of InfiniBand systems. Application Note 2004-03-17	PDF 2.10 MB Langues English \| 2004-03-17 \| PDF 2.10 MB 日本語 \| 2002-04-02 \| PDF 1.78 MB
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems. Application Note 2008-01-30	PDF 1.17 MB Langues English \| 2008-01-30 \| PDF 1.17 MB 日本語 \| 2008-03-31 \| PDF 2.89 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Langues English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment. Application Note 2005-06-15	PDF 515 KB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance. Application Note 2003-12-02	PDF 3.18 MB
Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices Application Note 2005-11-01	PDF 2.83 MB Langues English \| 2005-11-01 \| PDF 2.83 MB 日本語 \| 2006-07-21 \| PDF 4.74 MB
Loop Bandwidth and Clock Data Recovery in Oscilloscope Measurements (AN 1304-6) This application note describes loop bandwidth and clock data recovery in oscilloscope measurements. Application Note 2002-05-30	PDF 600 KB
Low Voltage Differential Signaling, (AN 1382-6) Using LVDS for High Speed Data Transmission Application Note 2001-12-17	PDF 2.53 MB Langues English \| 2001-12-17 \| PDF 2.53 MB 日本語 \| 2002-03-29 \| PDF 991 KB
Maximizing DDR BGA probe Bandwidth for Superior Signal Fidelity The use of BGA probes for probing DDR DRAM is becoming more popular and almost a requirement as memory design gets more complex and compact and data rate gets higher. DDR3 and DDR4 data rate is increasing from 800MT/s to possibly 3200MT/s. Application Note 2012-01-31	PDF 1.40 MB
Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR. Application Note 2011-07-08	PDF 1.77 MB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification. Application Note 2000-11-01	PDF 426 KB Langues English \| 2000-11-01 \| PDF 426 KB 日本語 \| 2002-09-30 \| PDF 707 KB
Measuring Close-In AM in the Presence of FM (PN 8590-5) This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface. AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is... Application Note 2000-07-01	PDF 137 KB
Measuring Differential Impedance with TDR to Improve High-Speed Bus Designs, (AN 1382-5) Improving High-Speed Bus Designs with TDR Application Note 2001-12-20	PDF 2.30 MB Langues English \| 2001-12-20 \| PDF 2.30 MB 日本語 \| 2002-04-02 \| PDF 1.58 MB
Measuring Jitter in Digital Systems (AN 1448-1) Measuring jitter and how to calculate total jitter. Application Note 2008-01-30	PDF 1.91 MB
Measuring Jitter with the Agilent E4874A Characterization Software Components The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then... Application Note 2000-06-01	PDF 102 KB
Measuring Third-Order Intermodulation, N dB Bandwidth, and Percent AM with Built-In Functions (PN... This Product Note explains how to use three of the advanced functions found in all 8590 C/E/L-series Spectrum Analyzers. The three functions are: Contents Third-Order Intermodulation N dB Bandwidth Percent AM Application Note 2000-07-01	PDF 86 KB
Meeting the Challenge of Computer System Validation This white paper shows the approach of using exerciser test cards to accomplish this objective. Application Note 2002-05-13
Method of Implementation (MOI) for DisplayPort Agilent Method of Implementation (MOI) for DisplayPort Sink Compliance Tests Application Note 2007-11-03	PDF 1.99 MB
Method of Implementation (MOI) for DisplayPort Sink Compliance Test Method of Implementation (MOI) for DisplayPort Sink Compliance Test Application Note 2008-08-18	PDF 1.87 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR. Application Note 2013-04-24	PDF 2.02 MB
Microprobing with the Agilent 86100A Infiniium DCA (AN 1304-3) A guide to making accurate measurements with the Agilent 86100A Infiniium DCA and Time Domain Reflectometer using Cascade Microtech high frequency probes. Application Note 2000-11-01	PDF 1.84 MB

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