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Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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Accelerating USB 3.0 Protocol Development 
Original broadcast June 27, 2012

Webcast - recorded

 
Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices 
Original broadcast Oct 28, 2008. Webcast slides available for download only.

Webcast - recorded

 
Digital Webcast Series - Master the high-speed digital test challenge 
multiple broadcasts - refer to www.agilent.com/find/DPTwebcasts for the complete list

Webcast - recorded

 
Events in Nordic countries 
Welcome to Agilent's Upcoming Events Page for Nordic countries

Seminar

 
Physical Layer design challenges for PCI Express® 3.0 and 2.0 designs 
You will learn advanced techniques for PCI Express phy-layer validation covering the latest PCIe 3.0 specification requirements as well as practical extensions to PCIe 2.0 and 1.1 designs. This seminar analyzes transmitter and receiver performance.

Webcast - recorded

 
Test & Measurement events in Europe, Middle East & Africa 
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar