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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Agilent - achieve your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more 
 

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New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

 
J-BERT N4903B High-Performance Serial BERT - Data Sheet 
Updated J-BERT N4903B data sheet revision 1.3. Especially PCIe3 related enhancements covered by our PR in Jan 2013. Also covers all enhancements since SW releases 6.80 to 7.40

Data Sheet 2014-06-12

Agilent EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Agilent EEsof EDA Newsletter.

Newsletter 2014-06-10

 
DOCSIS 3.1 Test Solution - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Agilent solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-05-13

PDF PDF 1.56 MB
DDR4 Protocol Analysis - FuturePlus 
DDR4 Protocol Analysis from FuturePlus and Agilent.

Solution Brief 2014-04-29

 
DisplayPort 1.2 Link Layer Testing - FuturePlus 
DisplayPort 1.2 Link Layer Testing Solution from FuturePlus and Agilent.

Solution Brief 2014-04-29

 
Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs 
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Agilent

Solution Brief 2014-04-29

 
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests 
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Agilent E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests 
Agilent Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Agilent E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Agilent E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note 
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2014-04-21

Agilent's Certification of HDMI 2.0 Test Solution 
Agilent Technologies Announces Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

 
Oscilloscope Probe Switching - BitifEye 
Oscilloscope Probe Switching Solution from BitifEye and Agilent.

Solution Brief 2014-04-09

 
USB 3.0 Cable Testing - BitifEye 
USB 3.0 Cable Testing Solution from BitifEye and Agilent.

Solution Brief 2014-04-09

 
HDMI Cable Testing - BitifEye 
HDMI Cable Testing Solution from BitifEye and Agilent.

Solution Brief 2014-04-09

 
MIPI™ Phy S-Param & Impedance Conformance Test - Test Solution Overview Using the ENA Option TDR 

Technical Overview 2014-04-08

PDF PDF 2.92 MB
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Agilent EEsof EDA's Channel on YouTube

Demo 2014-03-20

 
Discovering ADS 
A collection of Agilent EEsof EDA ADS video demonstrations and tutorials

Demo 2014-03-20

 
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests 
Agilent Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2014-02-20

PDF PDF 6.47 MB
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

 
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies 
This paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2014-02-18

PDF PDF 3.28 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-02-18

PDF PDF 947 KB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4 
This paper presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-02-18

PDF PDF 8.07 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links 
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-02-18

PDF PDF 1.78 MB

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