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1-25 / 381
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An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.
アプリケーション・ノート 2013-06-06 |
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Agilent EEsof EDAユーザ向けメールマガジン -- しみゅレター
アジレントEDAソリューションの技術情報やアプリケーション情報を定期的にお知らせするEメールニュースレターです。
ニュースレター 2013-06-03 |
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Agilent Introduces Electrical Retimer Solution to Solve Challenges in Designing Chip-to-Chip Links
Agilent introduces the latest addition to its repeater model library for quickly and accurately solving the challenge posed by signal distortion in the multigigabit-per-second regime.
プレス資料 2013-05-29 |
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Agilent EEsof EDA Customer Support Brochure
Whether you are a novice or an experienced user, Agilent EEsof EDA’s customer support offerings are designed to help you every step of the way.
ブローシャ 2013-05-28 |
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Agilent Technologies Announces High-Speed Digital Seminar Tour with Micron
Agilent announces its 2013 High-Speed Digital Tour, covering more than 20 locations throughout Europe.
プレス資料 2013-05-28 |
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Agilent EEsof EDA Software and Modular Solutions for Universities
Agilent works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.
ブローシャ 2013-05-27 |
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Ethernet 10GBASE-T Cable Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of 10GBASE-T Ethernet Cable Tests by using the Agilent E5071C ENA Option TDR.
技術概要 2013-05-21 |
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Agilent Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests
Agilent Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Agilent E5071C ENA Option TDR
アプリケーション・ノート 2013-05-21 |
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Momentum Overview
Overview video of Agilent Momentum, the gold standard in 3D planar electromagnetic simulation that enables your design of optimum laminar structures.
デモ 2013-05-08 |
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U4301A PCI Express® 3.0 Analyzer Module - Data Sheet
Agilent's U4301A PCI Express® 3.0 analyzer module is a protocol analyzer supporting all PCIe applications from Gen1 - Gen3 and speeds from 2.5 GT/s (Gen1) - PCI 8 GT/s (Gen3), link widths X1-X16.
データシート 2013-05-08 |
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N5399B HDMI Electrical Performance Validation and Compliance Software - Data Sheet
Data sheet for the N5399B HDMI Electrical Performance Validation and Compliance Software
データシート 2013-05-07 |
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ClioSoft Announces the Integration of SOS Design Data Management with Advanced Design System
ClioSoft's integrated solution offers ADS users seamlessly integrated revision control and enterprise design data management
プレス資料 2013-05-07 |
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Press Releases for N5990A
Press Releases for N5990A
プレス資料 2013-05-06 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
アプリケーション・ノート 2013-04-24 |
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PCI Express® Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of PCI Express® Compliance Testing by using the Agilent E5071C ENA Option TDR.
技術概要 2013-04-24 |
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Article series - Receiver Jitter Tolerance Testing with BERTS
Article series - Receiver Jitter Tolerance Testing with BERTS
プロモーション資料 2013-04-21 |
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High Speed Digital Design and Simulation Videos on YouTube
Agilent EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.
デモ 2013-04-19 |
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USB3.0 (SuperSpeed USB)の概要と評価、測定 - 5
USB3.0 SuperSpeed Channel S-parameter Tables の見方について
アプリケーション・ノート 2013-04-14 |
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EDA Support Services
Agilent Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.
ブローシャ 2013-04-09 |
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MOI for DisplayPort PHY CTS 1.2b Source Testing
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.
アプリケーション・ノート 2013-03-21 |
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MOI for DisplayPort PHY CTS 1.2b Sink Tests
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.
アプリケーション・ノート 2013-03-21 |
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Tips for Making Better Memory Measurements – Video Series
Videos that show customers how perform a comprehensive, unique and extensive analysis in less time.
デモ 2013-03-18 |
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Oscilloscope Probe Switching - BitifEye
Oscilloscope Probe Switching Solution from BitifEye and Agilent.
ソリューション概要 2013-03-18 |
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Agilent Technologies Launches Recognition Program for EDA Experts
Agilent launches its Agilent Certified Expert recognition program for EDA experts. Eligible participants include individuals demonstrating a high level of expertise-both theoretical and practical-in applying Agilent EEsof EDA tools for product design and modeling.
プレス資料 2013-03-12 |
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MHL Cable Compliance Test - Test Solution Overview Using the ENA Option TDR
This describes how to make measurements of MHL (Mobile High-definition Link) Cable Compliance Tests by using the Agilent E5071C ENA Option TDR.
技術概要 2013-02-22 |
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