Control & Automation of Instruments & Systems
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1-7 of 7
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A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.
Application Note 2005-01-27 |
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Defining three classes of LAN eXtensions for Instrumentation (LXI)
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.
Application Note 2006-01-12 |
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Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.
Application Note 2007-02-23 |
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
Application Note 2004-12-09 |
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The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.
Application Note 2006-11-27 |
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Tips and Tricks for Using USB, LAN and GPIB
This 12-page application note provides a variety of tips and tricks that will help you create flexible test systems that can easily incorporate USB, LAN, GPIB and RS-232C.
Application Note 2006-05-03 |
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Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment
Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment.
Application Note 2009-03-04 |
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