Control & Automation of Instruments & Systems

1-25 of 29

8 Hints for Debugging Siemens MCU-based Designs A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more... Application Note 1998-11-01	PDF 736 KB
8 More Hints for Making Better Scopes Measurements This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4... Application Note 1999-12-01	PDF 840 KB
A Comparison of Leading Switch/Measure Solutions This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments. Application Note 2005-01-27	PDF 241 KB Sprachen English \| 2005-01-27 \| PDF 241 KB 中文（简体） \| 2006-08-01 \| PDF 790 KB 日本語 \| 2005-02-28 \| PDF 645 KB
Application Note1: Check for PCI and PCI-X protocol rule violation The Agilent Protocol Observer, in combination with the Agilent Analyzer, simplifies the task of detecting protocol rule violations; this is not easy ... Application Note 2001-09-28	PDF 412 KB
Application Note3: Analyze how efficiently a device uses PCI/PCI-X resources The Agilent PCI/PCI-X Performance Optimizer, a combination of testcard and software, provides help regarding performance analysis of extensive systems or signle devices. If you perform benchmark tests, The Agilent PCI/PCI-X Performance Optimizer helps you quickly evaluate the performance of... Application Note 2001-10-04	PDF 469 KB
Application Note5: Monitor how your device acts on the PCI/PCI-X bus Monitoring traffic on the PCI/PCI-X bus is done easily, but if you are designing PCI/PCI-x devices, you need to monitor the traffic relating to a particular device. This application allows you to debug your system quickly and effectively. The Agilent PCI/PCI-X Analyzer, a combination of... Application Note 2001-10-04	PDF 406 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance Application Note 2008-10-15	PDF 281 KB Sprachen English \| 2008-10-15 \| PDF 281 KB 中文（简体） \| 2008-10-15 \| PDF 281 KB 日本語 \| 2008-10-15 \| PDF 1020 KB
Cathodic Protection of Steel in Concrete Using LXI This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion. Application Note 2007-04-25	PDF 390 KB
Defining three classes of LAN eXtensions for Instrumentation (LXI) The LXI standard defines three types of instruments that can be readily mixed and matched within a test system. Application Note 2006-01-12
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter. Application Note 2001-11-05	PDF 945 KB Sprachen English \| 2001-11-05 \| PDF 945 KB 日本語 \| 2002-06-18 \| PDF 604 KB
How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467) This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700. Application Note 2004-08-02	PDF 220 KB Sprachen English \| 2004-08-02 \| PDF 220 KB 中文（简体） \| 2004-08-02 \| PDF 220 KB 日本語 \| 2004-02-19 \| PDF 852 KB 中文（繁體） \| 2004-01-01 \| PDF 316 KB 한국어 \| 2004-02-10 \| PDF 316 KB
Increase Automotive ECU Test Throughput (AN 1505) Application Note 2004-10-22	PDF 58 KB Sprachen English \| 2004-10-22 \| PDF 58 KB 中文（简体） \| 2005-04-01 \| PDF 416 KB 日本語 \| 2005-02-15 \| PDF 230 KB 中文（繁體） \| 2004-12-28 \| PDF 350 KB 한국어 \| 2004-10-22 \| PDF 58 KB
Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) Application Note 2004-10-22	PDF 80 KB Sprachen English \| 2004-10-22 \| PDF 80 KB 中文（简体） \| 2005-04-01 \| PDF 645 KB 日本語 \| 2006-04-17 \| PDF 494 KB 中文（繁體） \| 2004-12-28 \| PDF 428 KB 한국어 \| 2004-10-22 \| PDF 80 KB
Innovative Power Supplies Save Rack Space In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis... Application Note 2004-12-16
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB. Application Note 2007-02-02	PDF 175 KB Sprachen English \| 2007-02-02 \| PDF 175 KB 中文（简体） \| 2007-02-02 \| PDF 175 KB 日本語 \| 2007-03-07 \| PDF 495 KB 中文（繁體） \| 2007-02-02 \| PDF 175 KB
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) Application Note 2005-07-27	PDF 110 KB Sprachen English \| 2005-07-27 \| PDF 110 KB 中文（简体） \| 2006-08-01 \| PDF 442 KB 日本語 \| 2006-04-12 \| PDF 332 KB
Next-generation Test Systems: Advancing the Vision with LXI - Application Note This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems. Application Note 2006-05-03	PDF 190 KB Sprachen English \| 2006-05-03 \| PDF 190 KB 中文（简体） \| 2005-08-01 \| PDF 1.33 MB 日本語 \| 2005-06-10 \| PDF 781 KB
PNA Automation - Connectivity Advances for Component Manufacturers LAN-enabled instruments are launching a new era in test and measurement. The ability to integrate test instrumentation with IT infrastructure is having a profound effect on how data is acquired and used in a modern facility. Application Note 2000-10-03	PDF 174 KB Sprachen English \| 2000-10-03 \| PDF 174 KB 中文（简体） \| 2004-02-05 \| PDF 3.65 MB 日本語 \| 2000-12-15 \| PDF 1.42 MB
Replacing the Agilent 34401A with the New 34410A/34411A High Performance Digital Multimeters This application note provides a high level overview of the differences between the Agilent 34401A 6 1/2 Digit Digital Multimeter and the new Agilent 34410A and 34411A 6 1/2 Digit High Performance DMMs. Application Note 2005-11-15	PDF 298 KB Sprachen English \| 2005-11-15 \| PDF 298 KB 中文（简体） \| 2005-12-01 \| PDF 1.35 MB 日本語 \| 2005-11-17 \| PDF 1.02 MB 中文（繁體） \| 2006-02-08 \| PDF 298 KB 한국어 \| 2005-11-15 \| PDF 298 KB
Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) Application Note 2004-10-22	PDF 57 KB Sprachen English \| 2004-10-22 \| PDF 57 KB 中文（简体） \| 2005-04-01 \| PDF 366 KB 日本語 \| 2005-04-14 \| PDF 185 KB 中文（繁體） \| 2004-12-29 \| PDF 286 KB 한국어 \| 2004-10-22 \| PDF 57 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems. Application Note 2007-02-23	PDF 234 KB Sprachen English \| 2007-02-23 \| PDF 234 KB 中文（简体） \| 2007-07-04 \| PDF 625 KB 日本語 \| 2005-02-17 \| PDF 960 KB
Test-System Development Guide: A Comprehensive Handbook for Test Engineers Test-System Development Guide Application Note 2012-05-07	PDF 5.04 MB Sprachen English \| 2012-05-07 \| PDF 5.04 MB 中文（简体） \| 2007-06-27 \| PDF 4.82 MB 中文（繁體） \| 2007-06-27 \| PDF 4.82 MB
Testing Uninterruptible Power Supplies Using Agilent 6800 Series ac Power Source/Analyzers This Product Note describes how Agilent ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection. Application Note 2001-01-16	PDF 430 KB
Using .NET Methods to Add Functionality to IVI-COM Drivers This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming. Application Note 2012-03-01	PDF 335 KB Sprachen English \| 2012-03-01 \| PDF 335 KB 中文（简体） \| 2012-03-01 \| PDF 335 KB
Using IVI For Your Instrument Driver This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice Application Note 2008-11-14	PDF 344 KB Sprachen English \| 2008-11-14 \| PDF 344 KB 中文（简体） \| 2008-11-14 \| PDF 344 KB 日本語 \| 2009-01-08 \| PDF 883 KB

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