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Control & Automation of Instruments & Systems

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10 Hints for Using Your Power Supply to Decrease Test Time 
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12

PDF PDF 3.18 MB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
Languages 
Cathodic Protection of Steel in Concrete Using LXI 
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
Choosing Your Test System Software Architecture (AN 1465-4) 

Application Note 2004-12-21

PDF PDF 409 KB
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Defining three classes of LAN eXtensions for Instrumentation (LXI) 
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.

Application Note 2006-01-12

 
How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.

Application Note 2004-08-02

PDF PDF 220 KB
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Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

PDF PDF 58 KB
Languages 
Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

PDF PDF 80 KB
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Increasing dc Power Supply Test System Throughput 
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB
Innovative Power Supplies Save Rack Space 
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

 
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note 
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

PDF PDF 175 KB
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Multi-channel Setup with Programmable Inter-channel Phase 
In the past, the problem has been to generate a number of synchronous signals with programmable phase difference. The attached Product Note explains how this can be solved by master/slaving a number of Agilent 3324A synthesized function generators.

Application Note 2004-02-20

PDF PDF 10 KB
Multi-channel signals with the Agilent E1440A 
The attached Application Note is an example describing the test of vehicle receivers used in Decca-type location systems that require a number of synthesizers to simulate the signals from a number of fixed transmitters. The frequencies, which are multiples of the master transmitter frequency...

Application Note 2004-02-20

PDF PDF 17 KB
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) 

Application Note 2005-07-27

PDF PDF 110 KB
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Next-generation Test Systems: Advancing the Vision with LXI - Application Note 
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Application Note 2006-05-03

PDF PDF 190 KB
Languages 
Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) 
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

PDF PDF 130 KB
Languages 
Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) 

Application Note 2004-10-22

PDF PDF 57 KB
Languages 
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly 
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

PDF PDF 234 KB
Languages 
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Testing Uninterruptible Power Supplies Using Agilent 6800 Series ac Power Source/Analyzers 
This Product Note describes how Agilent ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

PDF PDF 430 KB
Using IVI For Your Instrument Driver 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

PDF PDF 344 KB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

PDF PDF 182 KB
Languages 
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB

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