Control & Automation of Instruments & Systems
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1-14 of 14
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10 Hints for Using Your Power Supply to Decrease Test Time
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...
Application Note 1999-10-12 |
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Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.
Application Note 2007-04-25 |
PDF
390 KB
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Defining three classes of LAN eXtensions for Instrumentation (LXI)
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.
Application Note 2006-01-12 |
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How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.
Application Note 2004-08-02 |
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Increase Automotive ECU Test Throughput (AN 1505)
Application Note 2004-10-22 |
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Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)
Application Note 2004-10-22 |
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Increasing dc Power Supply Test System Throughput
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.
Application Note 2000-05-01 |
PDF
157 KB
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Innovative Power Supplies Save Rack Space
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...
Application Note 2004-12-16 |
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N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560)
Application Note 2005-07-27 |
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Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434)
This 15-page application note presents methods and techniques to decrease setup time and test time.
Application Note 2002-11-22 |
PDF
130 KB
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Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)
Application Note 2004-10-22 |
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Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.
Application Note 2007-02-23 |
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Testing Uninterruptible Power Supplies Using Agilent 6800 Series ac Power Source/Analyzers
This Product Note describes how Agilent ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.
Application Note 2001-01-16 |
PDF
430 KB
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Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer
Application Note 2007-04-25 |
PDF
234 KB
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