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Control & Automation of Instruments & Systems

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176-184 of 184

Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB. Application Note 2004-11-19	PDF 194 KB
Version 7.x ASAP Best Practices In an effort to standardize programming practices for the Agilent 5DX, Agilent has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process. Application Note 2001-07-25
Wastewater Treatment In this Application Note following the description of the wastewater treatment application, measurement and control requirements for characterizing the process are discussed. Then, Agilent VXI-based data acquisition equipment suitable for such an application is listed. Description... Application Note 1997-11-01	PDF 104 KB
What to Consider When Selecting the Optimal Test Strategy This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Agilent has performed in the quest to find the optimal test / inspection strategy. Application Note 2003-03-01	PDF 175 KB
When to Use AOI, When to Use AXI, and When to Use Both by Stig Oresjo, senior test strategy consultant at Agilent Technologies. Application Note 2002-12-01	PDF 70 KB
Windows & Unix Feature Comparison The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070. Application Note 2002-07-31	PDF 71 KB
Writing Flash Memory with Agilent 3070 Systems Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required! Application Note 2001-05-18	PDF 31 KB
X-ray Test Users Utilize BOM Explorer to Change Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested". Application Note 2007-10-12
“Shotgunning”, a Bad Fit for Lead-Free Test Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test Application Note 2006-02-07	PDF 44 KB

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