Control & Automation of Instruments & Systems

1-25 of 184

10 Good Reasons to Switch to LXI (AN 1465-21) This application note will help you make the transition to LXI. It describes 10 key attributes that make LXI a good choice for your next test system, whether you choose to use LXI alone or within a hybrid combination of LXI and GPIB, VXI or PXI. Application Note 2006-03-15	PDF 189 KB Sprachen English \| 2006-03-15 \| PDF 189 KB 中文（简体） \| 2006-07-01 \| PDF 800 KB 日本語 \| 2006-03-07 \| PDF 726 KB 中文（繁體） \| 2006-03-15 \| PDF 189 KB 한국어 \| 2006-03-15 \| PDF 189 KB
10 Hints for Using Your Power Supply to Decrease Test Time Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet... Application Note 1999-10-12	PDF 3.18 MB Sprachen English \| 1999-10-12 \| PDF 3.18 MB 中文（简体） \| 1999-10-12 \| PDF 3.18 MB 日本語 \| 2002-03-13 \| PDF 3.18 MB
3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones. Application Note 2001-08-15	PDF 223 KB
3070 In System Programming (ISP) Family On Board Programming, Bottom Line Benefits Application Note 2002-07-25	PDF 200 KB
3070 Increasing Throughput There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance. Application Note 1997-03-03	PDF 41 KB
3070 Series 3 Flash70 Programming Guide This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems. Application Note 2001-09-12	PDF 1.85 MB
3D Inline Solder Paste Inspection - Benefit Realized 100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects. Application Note 2003-06-01	PDF 59 KB
5DX Virus Protection Software Policy Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations. Application Note 2004-08-26
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems Application Note 2012-04-30	PDF 374 KB Sprachen English \| 2012-04-30 \| PDF 374 KB 中文（简体） \| 2005-10-05 \| PDF 1.43 MB 日本語 \| 2012-05-14 \| PDF 473 KB
8 Hints for Debugging Siemens MCU-based Designs A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more... Application Note 1998-11-01	PDF 736 KB
8 More Hints for Making Better Scopes Measurements This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4... Application Note 1999-12-01	PDF 840 KB
A Comparison of Leading Switch/Measure Solutions This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments. Application Note 2005-01-27	PDF 241 KB Sprachen English \| 2005-01-27 \| PDF 241 KB 中文（简体） \| 2006-08-01 \| PDF 790 KB 日本語 \| 2005-02-28 \| PDF 645 KB
A New Process for Measuring and Displaying Board Test Coverage Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California. Application Note 2003-01-01	PDF 116 KB
A Quality Test Demands A Quality Fixture A Check List for getting a quality board test fixture first time, every time. Application Note 2001-05-16	PDF 26 KB
Agilent 3070 Now Powered by Industrial PC Controllers The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs. Application Note 2003-01-23	PDF 207 KB
Agilent 3070 Outsource Series Pay-Per-Use Board Test System With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test. Application Note 2002-03-08	PDF 247 KB
Agilent LXI Class-B E5818A Trigger Box - Understanding Its Capability and Use Cases Learn more about the LXI Class B E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications. Application Note 2008-07-25	PDF 424 KB
Agilent TestJet Technology White Paper This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame. Application Note 2000-01-01
Antilock Brakes and Traction Control Application This Application Note describes the Antilock Brake System/Traction Control applications on Agilent TS-5400 Test System Application Note 2006-11-13	PDF 164 KB Sprachen English \| 2006-11-13 \| PDF 164 KB 日本語 \| 2000-01-18 \| PDF 355 KB
AOI - A Strategy for Closing the Loop This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications Application Note 2006-04-16	PDF 291 KB
Appliance Testing In this Application Note following the description of the appliance testing application, measurement and control requirements for characterizing devices are discussed. Then, Agilent VXI-based data acquisition suitable for such an application is listed. Description Household and commercial... Application Note 1997-11-01	PDF 110 KB
Application Note1: Check for PCI and PCI-X protocol rule violation The Agilent Protocol Observer, in combination with the Agilent Analyzer, simplifies the task of detecting protocol rule violations; this is not easy ... Application Note 2001-09-28	PDF 412 KB
Application Note3: Analyze how efficiently a device uses PCI/PCI-X resources The Agilent PCI/PCI-X Performance Optimizer, a combination of testcard and software, provides help regarding performance analysis of extensive systems or signle devices. If you perform benchmark tests, The Agilent PCI/PCI-X Performance Optimizer helps you quickly evaluate the performance of... Application Note 2001-10-04	PDF 469 KB
Application Note5: Monitor how your device acts on the PCI/PCI-X bus Monitoring traffic on the PCI/PCI-X bus is done easily, but if you are designing PCI/PCI-x devices, you need to monitor the traffic relating to a particular device. This application allows you to debug your system quickly and effectively. The Agilent PCI/PCI-X Analyzer, a combination of... Application Note 2001-10-04	PDF 406 KB
AXI and Lead-Free Process Characterization How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes. Application Note 2005-06-21

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