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Burn-In Test - LXinstruments 
Burn-in Testing Solutions from LXinstruments and Agilent.

解決方案簡介 2012-12-04

 
PXI Functional Test - TTCI 
PXI Functional Test Solution from TTCI and Agilent

解決方案簡介 2012-08-03

 
Functional Test - TTCI 
Functional Test Solutions from TTCI and Agilent.

解決方案簡介 2012-07-24

 
測試儀器模擬器 
WinSoft 和 Agilent 合作開發的測試儀器模擬解決方案。

解決方案簡介 2012-07-02

 
LXI Functional Test - LXinstruments 
LXI Functional Test Solutions from LXinstruments and Agilent.

解決方案簡介 2012-06-22

 
Automotive Radar Test - Konrad 
Automotive Radar Test Solution from Konrad and Agilent.

解決方案簡介 2012-06-12

 
Modular Functional Test – Circuit Check 
Modular Functional Test Solutions from Circuit Check and Agilent

解決方案簡介 2012-06-09

 
6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems 

應用手冊 2012-04-30

PDF PDF 374 KB
語言 
Power Supply Test – FineTest 
Power Supply Test Solutions from FineTest and Agilent

解決方案簡介 2012-03-14

 
Using .NET Methods to Add Functionality to IVI-COM Drivers  
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

應用手冊 2012-03-01

PDF PDF 335 KB
語言 
ECN article: Remote Wireless Test With LXI 
Article reprinted with approval from ECN magazine.

專文 2012-02-28

 
Self-diagnosing Switch Matrix Video (3min) 

基本展示 2010-11-14

 
The LXI System You Didn’t Know You Were Using  
The Evaluation Engineering article talks about the strength and stealth of LXI and Ethernet connectivity.

專文 2010-11-10

 
LXI Instrumentation applied to bioanalytical electrical characterization 

專文 2010-11-09

 
LXI 新聞稿 

新聞資料 2010-01-19

 
安捷倫 LXI 產品型錄 
The Agilent LXI Brochure shows you how to open the door to simpler system creation

型錄 2009-12-30

 
Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor 
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

應用手冊 2009-05-05

PDF PDF 415 KB
語言 
Tips in Using Agilent GPIB Solutions in National Instrument’s LabVIEW Environment 
Tips for using Agilent GPIB solutions in National Instrument’s LabVIEW environment.

應用手冊 2009-03-04

PDF PDF 711 KB
語言 
Using IVI For Your Instrument Driver 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

應用手冊 2008-11-14

PDF PDF 344 KB
語言 
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

應用手冊 2008-10-15

PDF PDF 281 KB
語言 
Agilent LXI Class-B E5818A Trigger Box - Understanding Its Capability and Use Cases 
Learn more about the LXI Class B E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.

應用手冊 2008-07-25

PDF PDF 424 KB
High Node Count Fixturing Solutions for Agilent Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Agilent 3070 family of board test systems.

應用手冊 2008-04-30

PDF PDF 67 KB
新一代的測試：LXI 概述 (AN 1465-30) 
新一代的測試：LXI 概述 (AN 1465-30)

促銷資料 2008-04-21

PDF PDF 1.89 MB
Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition 

應用手冊 2008-03-19

PDF PDF 270 KB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) 
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

應用手冊 2008-02-19

PDF PDF 671 KB
語言 

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