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Control & Automation of Instruments & Systems

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Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

Webcast - recorded

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Driving Down Test Cost, Schedule & Risk with Smart Switching Webcast 
Original broadcast May 30, 2012

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Network Analysis Back to Basics Webcast 
Recorded broadcast August 21, 2013

Webcast

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded

 
The Importance and Value of PXI Multi-Vendor Interoperability 
Original broadcast March 28, 2012

Webcast - recorded

 
Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast 
Live broadcast April 30, 2014; 10am PT / 1pm ET

Webcast

 
Tools and Tips for Ensuring Reliable Sensor Measurements and Logging Systems 
Original broadcast Mar 20, 2012

Webcast - recorded

 
Top Considerations to Integrating a PXI Automated Test System 
Original broadcast Apr 24, 2012

Webcast - recorded