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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

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Parametric Test Basic Training Part 2 
Originally broadcast Jan 19, 2011

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Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

網路廣播 -- 存檔