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Basics & Measurement Fundamentals

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Testing Transformers on Unpowered Systems 
This paper explains how to test basic analog parts, using unpowered systems.

Application Note 2003-03-21

PDF PDF 10 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment 
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Application Note 2007-10-31

PDF PDF 176 KB
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The Importance of Test and Inspection When Implementing Lead-Free Manufacturing 
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

Application Note 2004-08-20

PDF PDF 260 KB
The Life of a 5DX Inspection C# File 
The {Hashed Panel Name}.C# file is basically cad information about a panel program. It is used in conjunction with various utilities to overlay cad data on images or provide cad data for filters.

Application Note 2001-10-16

PDF PDF 97 KB
The Metrological & Financial Implications of a Clogged Fan Filter - White Paper 
This article discussed the implications of having a clogged air filter and addresses solutions to helping in the prevention of clogged air filters.

Application Note 2012-10-24

PDF PDF 1.41 MB
The Six Axes Of Calibration - White Paper 
To help demonstrate the variances in the deliverables and value of calibration due to lack of regulation. They have been split into 6 axes. This document discusses each of these axes.

Application Note 2012-10-24

PDF PDF 1.43 MB
The Why, Where, What, How, and When of X-ray Test 
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

Application Note 2000-11-01

PDF PDF 1.30 MB
Timing Considerations in Clock Distribution Networks (AN 1210-10) 
This Application Note discusses the different causes of skew in a clock distribution network. It shows how to use the Agilent 8133A and 54720A to measure and analyze the causes.

Application Note 1992-09-01

PDF PDF 253 KB
Tips for X-ray Users On Exporting NDF’s With No Loads Set To False 
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Application Note 2007-10-18

 
Too Much Calibration? - White Paper 
This paper explains the variables at work in the world of calibration - how they can be used to find the elusive balance point between cost and confidence, or "too much" and "not enough" calibration.

Application Note 2012-10-24

PDF PDF 1.23 MB
Troubleshooting Medalist Intelligent Test Framework Port Problems 
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.

Application Note 2008-05-22

PDF PDF 813 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

Application Note 2001-06-12

PDF PDF 16 KB
Uncertainty Analysis for Uncorrelated Input Quantities by Alberto Campillo 
Reference information for those who develop their own measurement uncertainties

Application Note 2011-08-01

PDF PDF 163 KB
Understanding and Configuring the 5DX Selftest and Black/White Level Tests 
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.

Application Note 2004-12-01

PDF PDF 158 KB
Understanding Measurement Risk - White Paper 
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

Application Note 2012-10-09

PDF PDF 749 KB
Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

Application Note 2004-12-21

PDF PDF 235 KB
Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2012-12-07

PDF PDF 2.28 MB
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Understanding the PCAP Polarity Reject Signal 
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

Application Note 2004-12-02

PDF PDF 1.09 MB
UNIX vs. Windows Differences for 3070 Users 
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.

Application Note 2002-09-19

 
Up-and-Down Programming DUT Power Supplies 
There seems to be some confusion on what the current limits are when using the DUT supplies in the Agilent 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.

Application Note 2001-05-17

PDF PDF 23 KB
Use of the Test Results Command Processor 
TRCMDPRO processes the results from the Agilent 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions.

Application Note 1998-01-12

PDF PDF 20 KB
Use of Wrong Thickness Technique Gives Bad Test Results 
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel.

Application Note 2000-12-31

 
Using a Manufacturer's Specification as a Type B Error Contribution - White Paper 
Examines the implications of using a manufacturer's specification in an uncertainty analysis; and how calibration laboratories use uncertainty data in their quality systems and customer-facing documents.

Application Note 2012-12-10

PDF PDF 1.13 MB
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

Application Note 2003-03-01

PDF PDF 502 KB
Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443) 
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.

Application Note 2008-05-22

PDF PDF 1.19 MB
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