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PNA - Pulsed Measurement Accuracy (1408-11) 

Application Note 2004-02-17

PDF PDF 1000 KB
Languages 
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

PDF PDF 1.23 MB
Languages 
PNA Automation - Software Application Development (1408-13) 

Application Note 2004-09-13

PDF PDF 961 KB
Languages 
PNA-X Application: Power-Added Efficiency (PAE) 1408-16 

Application Note 2007-10-09

PDF PDF 935 KB
Languages 
PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note 
This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

PDF PDF 3.38 MB
Languages 
Power Supply Testing (AN 372-1) 
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.

Application Note 2002-02-22

PDF PDF 510 KB
Languages 
Pragmatic Method for Pass/Fail Conformance Reporting that Complies by Michael Dobbert & Robert Stern 
Innovative approach to simultaneously meet (ISO 17025, ILAC-G8, Z540.3)

Application Note 2010-03-01

PDF PDF 350 KB
Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Application Note 2002-10-16

PDF PDF 70 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2004-02-20

PDF PDF 16 KB
Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200 
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.

Application Note 2008-07-28

PDF PDF 512 KB
Quad Flat No Lead (QFN) Best Practices 
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Application Note 2008-08-26

PDF PDF 492 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

Application Note 2003-08-01

PDF PDF 67 KB
Reducing Load Time for Loaderless Systems 
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

 
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

Application Note 2002-06-30

 
Rotating Boards on a Panel 
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.

Application Note 2001-05-17

PDF PDF 40 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Agilent manuals, and wish to use them to do external instrumentation control using the Agilent 3070 Board Test Family.

Application Note 2001-05-17

PDF PDF 23 KB
S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1967-02-01

PDF PDF 3.10 MB
Sampling on the Agilent 5DX 
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.

Application Note 2002-05-08

 
Selecting a Calibration Vendor - White Paper 
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?

Application Note 2012-12-11

PDF PDF 1.38 MB
SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment 
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.

Application Note 2006-06-15

PDF PDF 52 KB
Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations 
Results of a study on the use of characterized devices in microwave vector network analyzer (VNA) calibrations and measurements. A review of the theory of one-port characterized device calibration.

Application Note 2012-10-14

PDF PDF 1.25 MB
Setting and Using Specifications – An Overview, by Michael Dobbert 
This white paper presents techniques to set specifications and describes how metrologists use specifications in calibration.

Application Note 2010-09-01

PDF PDF 1.57 MB
Languages 
Setting Up HotKeys for AXI products on the Agilent Medalist Repair Tool 
Users of the Agilent Medalist Repair Tool, also known as the Agilent Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.

Application Note 2008-09-26

PDF PDF 629 KB

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