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Basics & Measurement Fundamentals

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10 Hints for Getting the Most from your Frequency Counter 
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.

Application Note 2008-04-18

PDF PDF 263 KB
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4 Hints for Making Better Microwave Counter Measurements 
This Product Note provides four pertinent hints for making better microwave counter measurements, describes the advantages of using a microwave counter, and deals with the unique measurement problems created by the advancement in counter technology.

Application Note 1998-09-01

PDF PDF 271 KB
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8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Agilent 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Application Note 1998-11-01

PDF PDF 736 KB
8 Hints for Making Better Measurements Using Analog RF Signal Generators 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2001-11-14

PDF PDF 1.01 MB
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8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2012-06-27

PDF PDF 1.35 MB
8 Hints for Making Better RF Counter Measurements 
This Brochure focuses on making better RF counter measurements by understanding the effects of counter architecture; recognizing the difference between resolution and accuracy, and scheduling calibration to match performance needs. In addition, the impact of timebase options is discussed along...

Application Note 2001-04-10

PDF PDF 194 KB
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8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
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8 Hints for Solving Common Debugging Problems with Your Logic Analyzer (AN 1326) 

Application Note 2007-04-19

PDF PDF 1000 KB
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8 Hints For Successful Impedance Measurement (AN 346-4) 
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

PDF PDF 599 KB
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8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

Application Note 1999-12-01

PDF PDF 840 KB
8510 Calibration - Measuring Noninsertable Devices (PN 8510-13) 
The majority of devices used in real-world microwave systems are noninsertable because of the connectors employed.

Application Note 2006-07-13

PDF PDF 261 KB
8510 Calibration Standard Definitions (AN 8510-5B) 
This Product Note covers methods for specifying calibration standards and describes the procedures for their use with the Agilent 8510 Network Analyzer.

Application Note 2006-07-13

PDF PDF 1.12 MB
8753ET/ES and 8719D/ET/ES, 8720D/ET/ES, and 8722D/ET/ES Network Analyzers Security Features 
Provides information concerning the structure, use, and clearing of user accessible memory inside the 8753ET/ES and 8719D/ET/ES, 8720D/ET/ES, and 8722D/ET/ES Network Analyzers.

Application Note 2006-02-15

PDF PDF 22 KB
Achieving Fast Design Cycle Time 
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

Application Note 2008-11-13

PDF PDF 461 KB
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Advanced impedance measurement capability of the RF I-V method (AN 1369-2) 
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

PDF PDF 753 KB
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An Introduction to Multiport and Balanced Device Measurements (AN 1373-1) 
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.

Application Note 2002-11-11

PDF PDF 522 KB
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Best of 8 Hints for Making Better Oscilloscopes Measurements  
Agilent engineers sharing ideas of how to use the equipment they design

Application Note 2008-03-17

PDF PDF 320 KB
Bluetooth® RF Measurement Fundamentals (AN 1333-1) 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Application Note 2006-10-12

PDF PDF 1.95 MB
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

PDF PDF 2.91 MB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB
Converting 8924C software for the E8285A 
This Product Note assumes you are converting software originally written for the Agilent 8924C, for use with the Agilent E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...

Application Note 2000-07-01

PDF PDF 378 KB
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ENA/PNA - Mixers - Calibration Accuracy using FCA (1408-3) 
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3

Application Note 2006-08-08

PDF PDF 1000 KB
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ENA/PNA - Mixers - Comparing Mixer Measurement Techniques (1408-2) 
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.

Application Note 2004-01-28

PDF PDF 265 KB
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