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如何以Agilent N67xxA模組化電源系統來取代Agilent 662xA
662Xa至N67xxA MPS轉換指南
應用手冊 2004-01-01 |
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測試系統開發指南：選擇您的測試系統軟體結構
應用手冊 2004-05-07 |
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8 Hints for Making Better Measurements Using Analog RF Signal Generators
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.
應用手冊 2001-11-14 |
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8 Hints for Making Better Measurements Using RF Signal Generators Application Note
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.
應用手冊 2012-06-27 |
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1.35 MB
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Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.
應用手冊 2006-10-12 |
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
應用手冊 2008-10-15 |
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How to use the Agilent 81200 together with Agilent VEE
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.
應用手冊 2002-01-28 |
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383 KB
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Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
應用手冊 2003-02-03 |
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Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.
應用手冊 2000-03-01 |
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Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B)
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary
of network analyzers and their capabilities.
應用手冊 2001-09-17 |
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Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1)
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.
應用手冊 2001-11-01 |
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183 KB
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Optimizing Dynamic Range for Distortion Measurements
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.
應用手冊 2011-10-27 |
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Power Supply Testing (AN 372-1)
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.
應用手冊 2002-02-22 |
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System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.
應用手冊 2004-10-19 |
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204 KB
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Test and Measurement Instrument Security
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.
應用手冊 2009-04-14 |
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167 KB
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Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing
應用手冊 2004-12-09 |
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189 KB
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
應用手冊 2004-12-21 |
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374 KB
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Timing Considerations in Clock Distribution Networks (AN 1210-10)
This Application Note discusses the different causes of skew in a clock distribution network. It shows how to use the Agilent 8133A and 54720A to measure and analyze the causes.
應用手冊 1992-09-01 |
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253 KB
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Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking
應用手冊 2004-09-14 |
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.
應用手冊 2004-07-29 |
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270 KB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
應用手冊 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
應用手冊 2005-03-29 |
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263 KB
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
應用手冊 2004-12-13 |
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408 KB
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Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for
Test & Measurement programmers. VISA COM
I/O is an update of the older VISA C API to work in and with COM technology.
應用手冊 2007-03-16 |
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345 KB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.
應用手冊 2004-11-19 |
PDF
194 KB
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