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Bluetooth RF 측정 기본 (AN 1333-1) 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

어플리케이션 노트 2006-10-12

PDF PDF 1.95 MB
언어 
테스트 시스템 개발 가이드: 테스트 시스템 소프트웨어 아키텍쳐 선택하기 

어플리케이션 노트 2004-05-07

PDF PDF 528 KB
언어 
8 Hints for Making Better Measurements Using Analog RF Signal Generators 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

어플리케이션 노트 2001-11-14

PDF PDF 1.01 MB
언어 
8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

어플리케이션 노트 2012-06-27

PDF PDF 1.35 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

어플리케이션 노트 2008-10-15

PDF PDF 281 KB
언어 
Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7) 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

어플리케이션 노트 2000-03-01

PDF PDF 529 KB
언어 
Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B) 
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary of network analyzers and their capabilities.

어플리케이션 노트 2001-09-17

PDF PDF 328 KB
언어 
Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1) 
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.

어플리케이션 노트 2001-11-01

PDF PDF 183 KB
언어 
Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

어플리케이션 노트 2011-10-27

PDF PDF
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

어플리케이션 노트 2004-10-19

PDF PDF 204 KB
Test and Measurement Instrument Security 
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.

어플리케이션 노트 2009-04-14

PDF PDF 167 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

어플리케이션 노트 2004-12-09

PDF PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

어플리케이션 노트 2004-12-21

PDF PDF 374 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

어플리케이션 노트 2004-09-14

PDF PDF 182 KB
언어 
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

어플리케이션 노트 2004-07-29

PDF PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

어플리케이션 노트 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

어플리케이션 노트 2005-03-29

PDF PDF 263 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

어플리케이션 노트 2004-12-13

PDF PDF 408 KB
Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

어플리케이션 노트 2007-03-16

PDF PDF 345 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

어플리케이션 노트 2004-11-19

PDF PDF 194 KB