Basics & Measurement Fundamentals
Refine the List
remove all refinementsBy Application
-
All Applications
- Fundamentals
By Type of Content
- Document Library
- Application Notes
- Application Note (168)
- Application Notes
By Product Category
101-125 of 168
|
Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4)
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.
Application Note 2000-08-01 |
PDF
80 KB
Languages
|
|
Network Analysis - In-Fixture Measurements (1287-9)
Application Note 2006-01-10 |
PDF
920 KB
Languages
|
|
Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.
Application Note 2000-03-01 |
PDF
529 KB
|
|
Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B)
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary
of network analyzers and their capabilities.
Application Note 2001-09-17 |
PDF
328 KB
|
|
Network Analysis Basics - Applying Error Correction To Network Analyzer Measurements (AN 1287-3)
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.
Application Note 2002-03-27 |
PDF
168 KB
|
|
Network Analysis Basics - Architecture Of Network Analyzers (AN 1287-2)
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.
Application Note 2000-12-06 |
PDF
1.42 MB
|
|
Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1)
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.
Application Note 2001-11-01 |
PDF
183 KB
Languages
|
|
Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10)
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...
Application Note 2003-05-25 |
PDF
Languages
|
|
Network Analyzer Basics
This 94-page note covers the principles of measuring high-frequency electrical networks with network analyzers, including the types of measuremetns and how they allow you to characterize both linear and nonlinear behavior of your devices.
Application Note 2004-09-15 |
PDF
5.82 MB
|
|
New Techniques for Analyzing Phase Lock Loops (AN 164-3)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1975-06-01 |
PDF
795 KB
|
|
Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16)
Application Note 2006-05-01 |
PDF
263 KB
|
|
Optical Spectrum Analysis Basics (AN 1550-4)
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...
Application Note 2000-09-01 |
PDF
222 KB
|
|
PLR and 5DX Customized Defect Names Implementation
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.
Application Note 2003-03-01 |
|
|
PNA - Amplifier - High-Power Testing (1408-10)
Application Note 2005-09-28 |
|
|
PNA - Amplifier Linear and Gain Compression Measurements (1408-7)
Application note covering testing of an amplifier's linear S-parameters and gain compression using Agilent's microwave PNA Series of vector network analyzers.
Application Note 2006-08-08 |
|
|
PNA - Amplifier Swept-Harmonic Measurements (1408-8)
This application note cover testing an amplifiers harmonics, using (MW) PNA Series of vector network analyzers. Linear parameters, such as gain and return loss are covered in Application Note 1408-7.
Application Note 2006-08-14 |
|
|
PNA - Amplifier-CW and Swept IMD Measurements (1408-9)
This application note covers testing an amplifier's intermodulation-distortion products, using (MW) PNA Series of vector network analyzers.
Application Note 2006-08-08 |
|
|
PNA - Analyze Lightwave Components (1408-14)
Application Note 2005-06-30 |
PDF
471 KB
|
|
PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.
Application Note 2009-11-24 |
PDF
1.95 MB
|
|
PNA - Pulsed Measurement Accuracy (1408-11)
Application Note 2004-02-17 |
PDF
1000 KB
|
|
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
|
|
PNA Automation - Software Application Development (1408-13)
Application Note 2004-09-13 |
PDF
961 KB
|
|
PNA-X Application: Power-Added Efficiency (PAE) 1408-16
Application Note 2007-10-09 |
PDF
935 KB
|
|
PNA-X Network Analyzer 10 MHz to 26.5 GHz Application Note
This application note describes accuracy considerations when using the Agilent PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.
Application Note 2012-03-05 |
PDF
3.38 MB
|
|
Power Supply Testing (AN 372-1)
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.
Application Note 2002-02-22 |
PDF
510 KB
|
Enroll in myAgilent
Register Your Product
Why Buy Agilent