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3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
3D Inline Solder Paste Inspection - Benefit Realized 
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.

Application Note 2003-06-01

PDF PDF 59 KB
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
Languages 
8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

Application Note 1999-12-01

PDF PDF 840 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.

Application Note 2003-01-01

PDF PDF 116 KB
A Technique for Calibrating Phase Shifters to High Accuracy (AN 19) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1966-05-01

PDF PDF 3.84 MB
Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System 
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.

Application Note 2008-06-12

 
Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System 
Tips on obtaining the best images using the 5DX surface map parameters.

Application Note 2008-06-19

 
Advanced TDR Techniques (AN 62-3) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1990-04-01

PDF PDF 2.73 MB
AOI - A Strategy for Closing the Loop 
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Application Note 2006-04-16

PDF PDF 291 KB
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards 
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.

Application Note 2006-10-24

PDF PDF 723 KB
Languages 
Best of 8 Hints for Making Better Oscilloscopes Measurements  
Agilent engineers sharing ideas of how to use the equipment they design

Application Note 2008-03-17

PDF PDF 320 KB
Bluetooth® RF Measurement Fundamentals (AN 1333-1) 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Application Note 2006-10-12

PDF PDF 1.95 MB
Languages 
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

Application Note 2003-03-01

PDF PDF 242 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Application Note 1998-05-27

PDF PDF 29 KB
Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface 
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.

Application Note 2008-09-04

PDF PDF 849 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
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Cellular Call Processing: Programming Techniques for the Agilent (AN 8920A) 
This Application Note specifically describes the programming format for AMPS cellular, however the techniques are similar for systems like NAMPS and TACS. The programming techniques used for the Agilent Technologies 8920A firmware have built-in cellular call processing functions. These techniques...

Application Note 1995-10-01

PDF PDF 582 KB
Choosing Your Test System Software Architecture (AN 1465-4) 

Application Note 2004-12-21

PDF PDF 409 KB
Languages 
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB
Comparing CAD and BOM data for 5DX Use 
Instructions for comparing CAD and BOM data to quickly deal with no load components.

Application Note 2008-01-04

PDF PDF 1.16 MB
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 164 KB
Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

Application Note 2009-01-14

PDF PDF 188 KB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

Application Note 2001-02-27

PDF PDF 47 KB
Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

Application Note 2008-10-21

PDF PDF 1.83 MB

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