Basics & Measurement Fundamentals

Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing. Application Note 2006-10-24	PDF 723 KB Languages English \| 2006-10-24 \| PDF 723 KB 日本語 \| 2007-07-11 \| PDF 2.46 MB
Electrical In-circuit Test Methods for Limited-access Boards This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access. Application Note 2001-02-27	PDF 47 KB
Maximising Test Coverage with Agilent Medalist VTEP v2.0 This paper describes how to get the most from Agilent Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM. Application Note 2007-04-17	PDF 227 KB Languages English \| 2007-04-17 \| PDF 227 KB 日本語 \| 2007-07-11 \| PDF 2.11 MB