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Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System 
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.

Notes d’application 2008-06-12

 
Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System 
Tips on obtaining the best images using the 5DX surface map parameters.

Notes d’application 2008-06-19

 
Advanced impedance measurement capability of the RF I-V method (AN 1369-2) 
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Notes d’application 2001-07-26

PDF PDF 753 KB
Langues 
Advanced TDR Techniques (AN 62-3) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Notes d’application 1990-04-01

PDF PDF 2.73 MB
Agilent 3070 Now Powered by Industrial PC Controllers 
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.

Notes d’application 2003-01-23

PDF PDF 207 KB
Agilent 3070 Outsource Series Pay-Per-Use Board Test System 
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Notes d’application 2002-03-08

PDF PDF 247 KB
Agilent TestJet Technology White Paper 
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Notes d’application 2000-01-01

 
An Internet-Enabled Primary Impedance Measurement System - White Paper 
iPIMMS allows microwave network analyser users to achieve uncertainties which are equivalent to those of measurementsperformed at the National Physical Laboratory (NPI).

Notes d’application 2012-09-26

PDF PDF 440 KB
An Introduction to Multiport and Balanced Device Measurements (AN 1373-1) 
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.

Notes d’application 2002-11-11

PDF PDF 522 KB
Langues 
AOI - A Strategy for Closing the Loop 
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications

Notes d’application 2006-04-16

PDF PDF 291 KB
Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1) 
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.

Notes d’application 1981-11-01

PDF PDF 7.65 MB
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards 
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.

Notes d’application 2006-10-24

PDF PDF 723 KB
Langues 
Attenuation Measurement of Step Attenuators 
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.

Notes d’application 2012-10-02

PDF PDF 440 KB
AXI and Lead-Free Process Characterization 
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.

Notes d’application 2005-06-21

 
Best of 8 Hints for Making Better Oscilloscopes Measurements  
Agilent engineers sharing ideas of how to use the equipment they design

Notes d’application 2008-03-17

PDF PDF 320 KB
Bluetooth® RF Measurement Fundamentals (AN 1333-1) 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Notes d’application 2006-10-12

PDF PDF 1.95 MB
Langues 
Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Notes d’application 2008-11-21

PDF PDF 2.91 MB
Langues 
Boundary Scan Ground Bounce Suppression 
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".

Notes d’application 1998-04-24

PDF PDF 14 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

Notes d’application 2003-03-01

PDF PDF 242 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Notes d’application 1998-05-27

PDF PDF 29 KB
Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface 
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.

Notes d’application 2008-09-04

PDF PDF 849 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Notes d’application 2008-10-15

PDF PDF 281 KB
Langues 
Business Considerations of Equipment Refresh in a Calibration Laboratory by Richard Ogg 
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.

Notes d’application 2011-10-05

PDF PDF 316 KB
Langues 
Calibration of a Ratio Transformer - White Paper 
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.

Notes d’application 2011-11-16

PDF PDF 2.30 MB
Calibration of Precision Step Attenuators - White Paper 
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.

Notes d’application 2012-10-14

PDF PDF 1.38 MB

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