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信号源の基礎 
現在の信号発生の課題にチャレンジする準備として、増幅器から安全性が高い通信システムまでのさまざまな製品をテストするのに必要な信号の基礎を取り上げます。これらの信号には単純なもので単一周波数の正弦波、...

アプリケーション・ノート 2001-09-21

PDF PDF 4.34 MB
3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

アプリケーション・ノート 2001-09-12

PDF PDF 1.85 MB
スペクトラム解析の基礎1998 Back to Basics Seminar 
スペクトラム解析がさまざまなアプリケーションにとって重要な理由と、スペクトラム・アナライザを使用して、システム性能やデバイス性能を測定する方法を学びます。スペクトラム・アナライザを紹介するために、動...

アプリケーション・ノート 2001-08-23

PDF PDF 5.61 MB
3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

アプリケーション・ノート 2001-08-15

PDF PDF 223 KB
Version 7.x ASAP Best Practices  
In an effort to standardize programming practices for the Agilent 5DX, Agilent has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process.

アプリケーション・ノート 2001-07-25

 
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

アプリケーション・ノート 2001-07-25

PDF PDF 42 KB
平衡測定の実例：バラン ＡＮ1373-6 
差動回路は、低周波アナログ回路で長く使われて来たのと同じ理由で、RF回路でも広く使われ始めています。差動回路のメリットには、電磁波障害／電源ノイズ／グランド・ノイズに対するイミュニティ、偶数次高調波の...

アプリケーション・ノート 2001-07-24

PDF PDF 399 KB
言語 
Digital Basics for Cable Television Systems 
If you install, upgrade, or maintain digital or mixed digital/analog systems, this book is your complete guide to this new world.

アプリケーション・ノート 2001-07-19

 
RF-IV法によるインピーダンス測定のネットワーク測定法に対する優位性(AN 1369-2) 
本アプリケーション・ノートでは、RF I-V測定法の説明を中心に、インピーダンス・アナライザとネットワーク・アナライザの違いを述べており、アプリケーションに応じた最適な測定方法を選択するために役立つ情報を提...

アプリケーション・ノート 2001-07-19

PDF PDF 1.17 MB
言語 
In-System Programming on the Agilent 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

アプリケーション・ノート 2001-07-02

PDF PDF 205 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

アプリケーション・ノート 2001-06-12

PDF PDF 16 KB
Writing Flash Memory with Agilent 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

アプリケーション・ノート 2001-05-18

PDF PDF 31 KB
Up-and-Down Programming DUT Power Supplies 
There seems to be some confusion on what the current limits are when using the DUT supplies in the Agilent 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.

アプリケーション・ノート 2001-05-17

PDF PDF 23 KB
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

アプリケーション・ノート 2001-05-17

PDF PDF 512 KB
Rotating Boards on a Panel 
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.

アプリケーション・ノート 2001-05-17

PDF PDF 40 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Agilent manuals, and wish to use them to do external instrumentation control using the Agilent 3070 Board Test Family.

アプリケーション・ノート 2001-05-17

PDF PDF 23 KB
Dealing with Board Thickness Variations 
The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.

アプリケーション・ノート 2001-05-16

PDF PDF 31 KB
Fundamentals of RF and Microwave Power Measurements (AN 64-1C) 
This Application Note is for information only. Agilent no longer sells or supports these products.

アプリケーション・ノート 2001-04-16

PDF PDF 2.21 MB
LCR/Impedance Measurement Basics 
presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques.

アプリケーション・ノート 2001-03-28

 
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

アプリケーション・ノート 2001-02-27

PDF PDF 575 KB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

アプリケーション・ノート 2001-02-27

PDF PDF 47 KB
Use of Wrong Thickness Technique Gives Bad Test Results 
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel.

アプリケーション・ノート 2000-12-31

 
Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

アプリケーション・ノート 2000-11-01

PDF PDF 61 KB
Learned Data for the 5DX 
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.

アプリケーション・ノート 2000-11-01

 
The Why, Where, What, How, and When of X-ray Test 
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

アプリケーション・ノート 2000-11-01

PDF PDF 1.30 MB

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