儀器作業系統與軟體
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Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.
應用手冊 2009-03-04 |
PDF
801 KB
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Measurement Wizard Assistant software for ENA
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.
應用手冊 2008-09-30 |
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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.
應用手冊 2008-07-28 |
PDF
512 KB
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Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443)
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.
應用手冊 2008-05-22 |
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1.19 MB
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Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.
應用手冊 2008-05-22 |
PDF
813 KB
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Using the Graphical Pin Locator on Agilent Medalist In-Circuit Test Systems
Enhancing productivity is the end result when the graphical version of "find pins" is utilized. This tool is called pin locator and is part of the Operator GUI Browser in version 7.0.
應用手冊 2008-05-03 |
PDF
203 KB
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Using the Auto Optimizer on the Agilent Medalist In-Circuit Test Systems
Learn how to optimize throughput by using the auto optimizer tool.
應用手冊 2008-05-03 |
PDF
237 KB
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Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for
Test & Measurement programmers. VISA COM
I/O is an update of the older VISA C API to work in and with COM technology.
應用手冊 2007-03-16 |
PDF
345 KB
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Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.
應用手冊 2006-08-08 |
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SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.
應用手冊 2006-06-15 |
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52 KB
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In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.
應用手冊 2005-05-25 |
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172 KB
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Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.
應用手冊 2004-12-08 |
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1.58 MB
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Understanding the PCAP Polarity Reject Signal
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.
應用手冊 2004-12-02 |
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1.09 MB
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Handling Surface Mapping with Varying Board Construction
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.
應用手冊 2004-12-02 |
PDF
1.02 MB
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Understanding and Configuring the 5DX Selftest and Black/White Level Tests
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.
應用手冊 2004-12-01 |
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158 KB
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PNA Automation - Software Application Development (1408-13)
應用手冊 2004-09-13 |
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961 KB
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5DX Virus Protection Software Policy
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.
應用手冊 2004-08-26 |
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測試系統開發指南：選擇您的測試系統軟體結構
應用手冊 2004-05-07 |
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Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
應用手冊 2004-02-20 |
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16 KB
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Discharge on Unpowered Agilent 3070 Systems
This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.
應用手冊 2003-06-13 |
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Non-Volatile Memory Programming on the Agilent 3070
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.
應用手冊 2003-05-29 |
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28 KB
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Testing Transformers on Unpowered Systems
This paper explains how to test basic analog parts, using unpowered systems.
應用手冊 2003-03-21 |
PDF
10 KB
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New Features in Version 5.0 Software for 3070
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.
應用手冊 2003-01-28 |
PDF
84 KB
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Design for Testability - Test for Designability
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.
應用手冊 2003-01-28 |
PDF
852 KB
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System Issues in Boundary-Scan Board Test
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.
應用手冊 2003-01-28 |
PDF
37 KB
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