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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011
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Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast
Live broadcast June 13, 2013; 7am Pacific and 10am Pacific
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Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012
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Driving Down Test Cost, Schedule & Risk with Smart Switching
Original broadcast May 30, 2012
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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012
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Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013
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Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast
Original broadcast April 4, 2013
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Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011
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PXI, AXIe, DAQ and Modular Solutions Webcast Series
Live and on-demand webcasts, various dates in 2012
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Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011
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The Importance and Value of PXI Multi-Vendor Interoperability
Original broadcast March 28, 2012
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Tools and Tips for Ensuring Reliable Sensor Measurements and Logging Systems
Original broadcast Mar 20, 2012
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Top Considerations to Integrating a PXI Automated Test System
Original broadcast Apr 24, 2012
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