设备操作系统和软件
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Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.
应用说明 2009-03-04 |
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801 KB
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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.
应用说明 2008-07-28 |
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512 KB
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Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.
应用说明 2008-05-22 |
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813 KB
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Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443)
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.
应用说明 2008-05-22 |
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1.19 MB
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Using the Auto Optimizer on the Agilent Medalist In-Circuit Test Systems
Learn how to optimize throughput by using the auto optimizer tool.
应用说明 2008-05-03 |
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237 KB
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Using the Graphical Pin Locator on Agilent Medalist In-Circuit Test Systems
Enhancing productivity is the end result when the graphical version of "find pins" is utilized. This tool is called pin locator and is part of the Operator GUI Browser in version 7.0.
应用说明 2008-05-03 |
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203 KB
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Using the VISA COM I/O API in .NET - Application Note
The Microsoft .NET architecture has many features that make it an excellent environment for
Test & Measurement programmers. VISA COM
I/O is an update of the older VISA C API to work in and with COM technology.
应用说明 2007-03-16 |
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345 KB
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安捷伦测试奇才助手
安捷伦测试奇才助手
应用说明 2006-09-01 |
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测试系统开发指南AN1465-4
测试系统开发指南AN1465-4
应用说明 2006-09-01 |
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Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.
应用说明 2006-08-08 |
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SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.
应用说明 2006-06-15 |
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52 KB
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In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.
应用说明 2005-05-25 |
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172 KB
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Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.
应用说明 2004-12-08 |
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1.58 MB
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Handling Surface Mapping with Varying Board Construction
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.
应用说明 2004-12-02 |
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1.02 MB
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Understanding the PCAP Polarity Reject Signal
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.
应用说明 2004-12-02 |
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1.09 MB
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Understanding and Configuring the 5DX Selftest and Black/White Level Tests
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.
应用说明 2004-12-01 |
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158 KB
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PNA Automation - Software Application Development (1408-13)
应用说明 2004-09-13 |
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961 KB
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5DX Virus Protection Software Policy
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.
应用说明 2004-08-26 |
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Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
应用说明 2004-02-20 |
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16 KB
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Discharge on Unpowered Agilent 3070 Systems
This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.
应用说明 2003-06-13 |
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Non-Volatile Memory Programming on the Agilent 3070
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.
应用说明 2003-05-29 |
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28 KB
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Testing Transformers on Unpowered Systems
This paper explains how to test basic analog parts, using unpowered systems.
应用说明 2003-03-21 |
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10 KB
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System Issues in Boundary-Scan Board Test
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.
应用说明 2003-01-28 |
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37 KB
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New Features in Version 5.0 Software for 3070
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.
应用说明 2003-01-28 |
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84 KB
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Design for Testability - Test for Designability
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.
应用说明 2003-01-28 |
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852 KB
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