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Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

應用手冊 2013-10-29

PDF PDF 16 KB
Enhanced Log Records for the Agilent Medalist In-Circuit Test System 
Track changes made to your i3070 test programs to improve success.

應用手冊 2009-03-04

PDF PDF 801 KB
Measurement Wizard Assistant software for ENA 
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

應用手冊 2008-09-30

Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200 
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.

應用手冊 2008-07-28

PDF PDF 512 KB
Troubleshooting Medalist Intelligent Test Framework Port Problems 
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.

應用手冊 2008-05-22

PDF PDF 813 KB
Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443) 
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.

應用手冊 2008-05-22

Using the Auto Optimizer on the Agilent Medalist In-Circuit Test Systems  
Learn how to optimize throughput by using the auto optimizer tool.

應用手冊 2008-05-03

PDF PDF 237 KB
Using the Graphical Pin Locator on Agilent Medalist In-Circuit Test Systems 
Enhancing productivity is the end result when the graphical version of "find pins" is utilized. This tool is called pin locator and is part of the Operator GUI Browser in version 7.0.

應用手冊 2008-05-03

PDF PDF 203 KB
Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

應用手冊 2007-03-16

PDF PDF 345 KB
Considerations for Surface Map Setup 
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.

應用手冊 2006-08-08

 
SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment 
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.

應用手冊 2006-06-15

PDF PDF 52 KB
In-circuit Testing of Low Voltage Devices 
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

應用手冊 2005-05-25

PDF PDF 172 KB
Testing FPGullwing Misalignment Across the Pad 
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.

應用手冊 2004-12-08

PDF PDF 1.58 MB
Understanding the PCAP Polarity Reject Signal 
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

應用手冊 2004-12-02

PDF PDF 1.09 MB
Handling Surface Mapping with Varying Board Construction 
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.

應用手冊 2004-12-02

PDF PDF 1.02 MB
Understanding and Configuring the 5DX Selftest and Black/White Level Tests 
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.

應用手冊 2004-12-01

PDF PDF 158 KB
PNA Automation - Software Application Development (1408-13) 

應用手冊 2004-09-13

5DX Virus Protection Software Policy 
Agilent recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.

應用手冊 2004-08-26

 
測試系統開發指南:選擇您的測試系統軟體結構 

應用手冊 2004-05-07

Discharge on Unpowered Agilent 3070 Systems 
This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.

應用手冊 2003-06-13

 
Non-Volatile Memory Programming on the Agilent 3070 
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.

應用手冊 2003-05-29

PDF PDF 28 KB
Testing Transformers on Unpowered Systems 
This paper explains how to test basic analog parts, using unpowered systems.

應用手冊 2003-03-21

PDF PDF 10 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

應用手冊 2003-01-28

PDF PDF 852 KB
New Features in Version 5.0 Software for 3070 
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

應用手冊 2003-01-28

PDF PDF 84 KB
System Issues in Boundary-Scan Board Test 
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.

應用手冊 2003-01-28

PDF PDF 37 KB

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