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Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.
應用手冊 2000-11-01 |
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High Precision Time Domain Reflectometry (AN 1304-7)
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements
應用手冊 2003-10-27 |
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High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.
應用手冊 2003-09-12 |
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Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.
應用手冊 2012-10-30 |
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
應用手冊 2000-11-01 |
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Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.
應用手冊 2009-02-20 |
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Time Domain Reflectometry Theory (AN 1304-2)
This application note discusses the fundamentals of TDR and then relates these fundamentals to the parameters that can be measured in actual test situations.
應用手冊 2002-08-29 |
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Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.
應用手冊 2012-02-08 |
