聯絡安捷倫專家

阻抗

在被動元件產業,以及在材料、電源供應等眾多產業中,阻抗量測都佔有重要的地位。 比方說,電容 (C)、電感 (L) 和電阻 (R) 等物理參數,皆以阻抗為基礎進行量測。 此外,還可經由阻抗量測推導出材料參數(介電常數: ε,磁導率: μ)。 安捷倫提供完整的阻抗測試設備和測試配件,可協助您進行量測。 當您選擇安捷倫的阻抗量測產品,除了獲得準確可靠的測試結果外,還能享有更多的支援服務。

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On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent

解決方案簡介 2014-04-16

 
Automated LAN Cable Test System - Beta LaserMike 
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.

解決方案簡介 2014-04-09

 
Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent

解決方案簡介 2014-04-02

 
Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent

解決方案簡介 2014-04-02

 
Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent

解決方案簡介 2014-04-02

 
Accessories Selection Guide For Impedance Measurements - Selection Guide 
This selection guide introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers.

選購指南 2014-01-24

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers 
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

應用手冊 2013-09-27

The Impedance Measurement Handbook-4th Edition - Application Note 
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

應用手冊 2013-09-10

Impedance and Network Analysis Application List Application Note 
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

應用手冊 2012-10-30

PDF PDF 1.11 MB
Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed 
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.

應用手冊 2009-02-03

PDF PDF 1.33 MB
Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

應用手冊 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8) 
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

應用手冊 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz) 
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

應用手冊 2008-11-20

Effective Transformer/LF Coil Testing (AN 1305-3) 
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...

應用手冊 2008-11-20

E4991A Technical Overview 
This describes the E4991A 3GHz RF impedance/material analyzer and new 3 GHz test fixtures. It provides information for high frequency device evaluation such as chip inductor, chip capacitor and EMI filters.

技術總覽 2008-11-20

Achieving Fast Design Cycle Time 
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

應用手冊 2008-11-13

4294A Technical Overview 
The 4294A precision impedance analyzer provides accurate impedance measurement and analysis of a wide variety of electronic devices as well as electronic and non-electronic material.

技術總覽 2008-11-13

Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2) 
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

應用手冊 2008-04-10

PDF PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1) 
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

應用手冊 2008-04-03

PDF PDF 119 KB
Accelerate Your MEMS Device Development and Manufacturing Efficiency 
This brochure describes a general overview of Agilent's capabilities in MEMS device testing and generates awareness of Agilent impedance MEMS test solution to customer.

型錄 2007-11-12

PDF PDF 804 KB
Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer 
This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.

應用手冊 2007-03-31

Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM) 
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.

應用手冊 2006-11-29

Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9) 
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

應用手冊 2006-06-26

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3) 
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

應用手冊 2003-06-26

Agilent LCR 錶,阻抗分析儀與測試夾具選購指南 

選購指南 2002-12-24

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