阻抗
阻抗测量不仅在无源元器件领域具有举足轻重的作用，在材料、电源等领域也非常重要。很多物理参数，例如电容（C）、电感（L）和电阻（R）都是以阻抗为基础进行测量。此外，材料参数（电容率：ε，导磁率：μ）也可通过阻抗测量导出。安捷伦具有全套的阻抗测试设备和测试附件，可帮助您完成测量。选择安捷伦的阻抗测量产品，您不仅可获得精确、可靠的测试结果，还能获得更多益处。
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Automated LAN Cable Test System - Beta LaserMike
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.
Solution Brief 2012-12-20 |
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Impedance Matching for High Power Devices - Maury Microwave
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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Mobile Phone Load Pull Measurements - Maury Microwave
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Agilent
Solution Brief 2012-12-04 |
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Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.
应用说明 2012-10-30 |
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1.11 MB
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LCR 表、阻抗分析仪和测试夹具
LCR 表、阻抗分析仪和测试夹具
选型指南 2012-06-01 |
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安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
应用说明 2011-12-31 |
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On-Wafer High Power Load Pull Measurements – bsw TestSystems
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent
Solution Brief 2011-12-16 |
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安捷伦高效变压器/低频线圈测试 应用指南 1305-3
安捷伦高效变压器/低频线圈测试 应用指南 1305-3
应用说明 2011-02-01 |
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Agilent 4294A精密阻抗分析仪 40 Hz 到 110 MHz
The 4294A precision impedance analyzer provides accurate impedance measurement and analysis of a wide variety of electronic devices as well as electronic and non-electronic material.
技术总览 2010-12-01 |
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Agilent E4991A射频阻抗/材料分析仪
This describes the E4991A 3GHz RF impedance/material analyzer and new 3 GHz test fixtures. It provides information for high frequency device evaluation such as chip inductor, chip capacitor and EMI filters.
技术总览 2010-12-01 |
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
应用说明 2009-06-17 |
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Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.
应用说明 2009-02-03 |
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1.33 MB
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Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
应用说明 2008-12-10 |
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Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.
应用说明 2008-11-21 |
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New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...
应用说明 2008-11-20 |
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Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
应用说明 2008-11-13 |
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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
应用说明 2008-10-28 |
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1.65 MB
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Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.
应用说明 2008-04-10 |
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116 KB
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Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.
应用说明 2008-04-03 |
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119 KB
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用于电阻测量的附件选购指南
可与LCR表、电阻表、电容表、电阻分析仪和组合分析仪结合使用的电阻测试夹具
选型指南 2007-12-13 |
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Accelerate Your MEMS Device Development and Manufacturing Efficiency
This brochure describes a general overview of Agilent's capabilities in MEMS device testing and generates awareness of Agilent impedance MEMS test solution to customer.
手册 2007-11-12 |
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804 KB
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Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer
This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.
应用说明 2007-03-31 |
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Impedance Characteristic Evaluation of SMD by Using the ENA with Inter-Continental Microwave (ICM)
This application note describes impedance characteristic evaluation of SMD by using the ENA RF network analyzer with the ICM test fixture.
应用说明 2006-11-29 |
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Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.
应用说明 2006-06-26 |
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