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10 Hints for Using Your Power Supply to Decrease Test Time 
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12

PDF PDF 3.18 MB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
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How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.

Application Note 2004-08-02

PDF PDF 220 KB
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Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

PDF PDF 58 KB
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Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

PDF PDF 80 KB
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Increasing dc Power Supply Test System Throughput 
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB
Innovative Power Supplies Save Rack Space 
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

 
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) 

Application Note 2005-07-27

PDF PDF 110 KB
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Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) 
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

PDF PDF 130 KB
Languages 
Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) 

Application Note 2004-10-22

PDF PDF 57 KB
Languages 
Testing Uninterruptible Power Supplies Using Agilent 6800 Series ac Power Source/Analyzers 
This Product Note describes how Agilent ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

PDF PDF 430 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing 
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB